The dynamic observation of surfaces has been developed by using a scanning Auger electron microscope (SAM). The images of Auger and secondary electrons are photographed continuously with a 16‐mm movie camera. Each frame is photographed for very short time exposures of 24 to 48 s for the Auger and 3 s for the secondary electrons. Particular logic circuits to control the system were made providing for the rejection of the secondary electrons ejected by the ions and for the photons from the filament of the ion gun which greatly degrade the images.