A broad‐band optical reflector based on the localization of light for one‐dimensional disordered systems is proposed and demonstrated both theoretically and experimentally. The binary disordered multilayer reflector consists of alternating random layers of two coating materials. Its high reflection range is much wider than that of standard &lgr;/4 stacks and can be obtained by a conventional coating method and ordinary materials. This kind of reflector will have significant applications in laser technology and optical equipment. ©1995 American Institute of Physics.