Leakage current analysis for InyGa1−yPzAs1−z/AlxGa1−xAs double heterostructure lasers
作者:
Sheng Lan,
Yuen‐Chuen Chan,
Wan‐Jing Xu,
De‐Long Cui,
Cheng‐Qing Yang,
Hong‐Du Liu,
期刊:
Journal of Applied Physics
(AIP Available online 1996)
卷期:
Volume 80,
issue 11
页码: 6355-6359
ISSN:0021-8979
年代: 1996
DOI:10.1063/1.363654
出版商: AIP
数据来源: AIP
摘要:
A band offset diagram for the heterojunction InyGa1−yPzAs1−z/AlxGa1−xAs based on the transitivity rule and our measured band offset for In0.5Ga0.5P/GaAs is given. A carrier leakage analysis is developed and explains the experimental observations in 670 nm visible InyGa1−yPzAs1−z/AlxGa1−xAs double heterostructure (DH) lasers. The analysis based on the performance of this laser verifies that our band offset is more accurate than previous values. In contrast to GaAs/AlxGa1−xAs, InGaPAs/InP and InGaP/AlGaInP DH lasers, we found that the leakage of holes, rather than of electrons, is responsible for the high threshold current density of this type of laser. ©1996 American Institute of Physics.
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