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Leakage current analysis for InyGa1−yPzAs1−z/AlxGa1−xAs double heterostructure lasers

 

作者: Sheng Lan,   Yuen‐Chuen Chan,   Wan‐Jing Xu,   De‐Long Cui,   Cheng‐Qing Yang,   Hong‐Du Liu,  

 

期刊: Journal of Applied Physics  (AIP Available online 1996)
卷期: Volume 80, issue 11  

页码: 6355-6359

 

ISSN:0021-8979

 

年代: 1996

 

DOI:10.1063/1.363654

 

出版商: AIP

 

数据来源: AIP

 

摘要:

A band offset diagram for the heterojunction InyGa1−yPzAs1−z/AlxGa1−xAs based on the transitivity rule and our measured band offset for In0.5Ga0.5P/GaAs is given. A carrier leakage analysis is developed and explains the experimental observations in 670 nm visible InyGa1−yPzAs1−z/AlxGa1−xAs double heterostructure (DH) lasers. The analysis based on the performance of this laser verifies that our band offset is more accurate than previous values. In contrast to GaAs/AlxGa1−xAs, InGaPAs/InP and InGaP/AlGaInP DH lasers, we found that the leakage of holes, rather than of electrons, is responsible for the high threshold current density of this type of laser. ©1996 American Institute of Physics.

 

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