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Field-ion microscopy

 

作者: H.N. Southworth,  

 

期刊: Contemporary Physics  （Taylor Available online 1970）
卷期: Volume 11, issue 3  

页码: 209-226

 

ISSN:0010-7514

 

年代: 1970

 

DOI:10.1080/00107517008202178

 

出版商: Taylor & Francis Group

 

数据来源: Taylor

 

摘要:

Field-ion microscopy is a comparatively new technique for studying the internal structure of solids. It is also unique in that it is able to resolve the individual atoms composing the solid structure.

 

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