Structure of cross‐tie wall in thin Co films resolved by magnetic force microscopy
作者:
M. Lo¨hndorf,
A. Wadas,
H. A. M. van den Berg,
R. Wiesendanger,
期刊:
Applied Physics Letters
(AIP Available online 1996)
卷期:
Volume 68,
issue 25
页码: 3635-3637
ISSN:0003-6951
年代: 1996
DOI:10.1063/1.115754
出版商: AIP
数据来源: AIP
摘要:
We have studied the magnetic domain structure of a thin polycrystalline Co film by magnetic force microscopy (MFM). Domain walls of the cross‐tie type have been observed for a Co film of 50 nm thickness. Due to the high lateral resolution of MFM we have been able to study the magnetic structure of a single cross tie. We have determined locations of Bloch lines within a domain wall comparing the experimental data with a theoretical model of a cross‐tie wall. In order to explain our experimental results we have proposed a model for the interaction between a MFM tip and a cross‐tie wall. ©1996 American Institute of Physics.
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