Low Level Determination of Metallics in Graphite by Analytical Spectroscopy
作者:
N.K. Porwal,
S.K. Thulasidas,
S.V. Godbole,
ParuJ. Purohit,
Neelam Goyal,
A.G. Page,
期刊:
Analytical Letters
(Taylor Available online 1996)
卷期:
Volume 29,
issue 5
页码: 821-831
ISSN:0003-2719
年代: 1996
DOI:10.1080/00032719608001787
出版商: Taylor & Francis Group
关键词: Atomic Emission Spectrometry Determination of Trace Metals;Carrier Excitation;Atomic Absorption Spectrometry
数据来源: Taylor
摘要:
Analytical atomic absorption/emission spectrometric methods have been developed for determination of 22 metallics at low concentration levels in high purity graphite material required in nuclear fuel industry. Of these, 21 metallics viz., Al,B, Be, Ca, Cd, Cr, Co, Cu, Fe, Li, Mn, Mo, Mg, Ni, Pb, Sn, Si, Ti, V, W and Zn are determined at trace concentration levels by D.C. arc Atomic Emission Spectrometric method using carrier excitation technique with a 6% carrier mixture of AgCl and NaF in a 5:1 proportion. Using the standardized procedure B, Be and Cd can be determined at 0.1 ppm concentrations while most of the other elements could be determined at 5–50 ppm concentrations. The detection limit for W was however 100 ppm. The precision of the method has been better than 20% RSD.
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