首页   按字顺浏览 期刊浏览 卷期浏览 Low Level Determination of Metallics in Graphite by Analytical Spectroscopy
Low Level Determination of Metallics in Graphite by Analytical Spectroscopy

 

作者: N.K. Porwal,   S.K. Thulasidas,   S.V. Godbole,   ParuJ. Purohit,   Neelam Goyal,   A.G. Page,  

 

期刊: Analytical Letters  (Taylor Available online 1996)
卷期: Volume 29, issue 5  

页码: 821-831

 

ISSN:0003-2719

 

年代: 1996

 

DOI:10.1080/00032719608001787

 

出版商: Taylor & Francis Group

 

关键词: Atomic Emission Spectrometry Determination of Trace Metals;Carrier Excitation;Atomic Absorption Spectrometry

 

数据来源: Taylor

 

摘要:

Analytical atomic absorption/emission spectrometric methods have been developed for determination of 22 metallics at low concentration levels in high purity graphite material required in nuclear fuel industry. Of these, 21 metallics viz., Al,B, Be, Ca, Cd, Cr, Co, Cu, Fe, Li, Mn, Mo, Mg, Ni, Pb, Sn, Si, Ti, V, W and Zn are determined at trace concentration levels by D.C. arc Atomic Emission Spectrometric method using carrier excitation technique with a 6% carrier mixture of AgCl and NaF in a 5:1 proportion. Using the standardized procedure B, Be and Cd can be determined at 0.1 ppm concentrations while most of the other elements could be determined at 5–50 ppm concentrations. The detection limit for W was however 100 ppm. The precision of the method has been better than 20% RSD.

 

点击下载:  PDF (329KB)



返 回