首页   按字顺浏览 期刊浏览 卷期浏览 Enhanced hydrogenation and acceptor passivation in Si by pressurized water boiling
Enhanced hydrogenation and acceptor passivation in Si by pressurized water boiling

 

作者: Y. Ohmura,   Y. Otomo,   Y. Tago,   N. Terakado,   T. Satoh,  

 

期刊: Applied Physics Letters  (AIP Available online 1995)
卷期: Volume 67, issue 1  

页码: 64-66

 

ISSN:0003-6951

 

年代: 1995

 

DOI:10.1063/1.115494

 

出版商: AIP

 

数据来源: AIP

 

摘要:

It has been shown that a pressurized water boiling (PWB) at 2 atmospheric pressures and 120 °C in an autoclave vessel accelerates significantly hydrogenation and neutralization of B acceptors in Si. Compared with boiling at atmospheric pressure, PWB reduces more the free‐hole IR absorption and increases more the sheet resistivity in B implantedp+layer onn‐type substrate. An IR absorption of B–H stretching vibration (∼1907 cm−1) has been detected at 16 K for ap+layer which was PWB processed for only 6 h. Concentration increase of H‐related species in water and faster diffusion of H in Si at higher temperature may be the cause. In contrast with other hydrogenation techniques, water boiling hardly passivates donors in Si even for 10 h PWB. ©1995 American Institute of Physics.

 

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