Enhanced hydrogenation and acceptor passivation in Si by pressurized water boiling
作者:
Y. Ohmura,
Y. Otomo,
Y. Tago,
N. Terakado,
T. Satoh,
期刊:
Applied Physics Letters
(AIP Available online 1995)
卷期:
Volume 67,
issue 1
页码: 64-66
ISSN:0003-6951
年代: 1995
DOI:10.1063/1.115494
出版商: AIP
数据来源: AIP
摘要:
It has been shown that a pressurized water boiling (PWB) at 2 atmospheric pressures and 120 °C in an autoclave vessel accelerates significantly hydrogenation and neutralization of B acceptors in Si. Compared with boiling at atmospheric pressure, PWB reduces more the free‐hole IR absorption and increases more the sheet resistivity in B implantedp+layer onn‐type substrate. An IR absorption of B–H stretching vibration (∼1907 cm−1) has been detected at 16 K for ap+layer which was PWB processed for only 6 h. Concentration increase of H‐related species in water and faster diffusion of H in Si at higher temperature may be the cause. In contrast with other hydrogenation techniques, water boiling hardly passivates donors in Si even for 10 h PWB. ©1995 American Institute of Physics.
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