Electron paramagnetic resonance of extended defects in semi‐insulating GaAs
作者:
A. Goltzene,
B. Meyer,
C. Schwab,
期刊:
Journal of Applied Physics
(AIP Available online 1982)
卷期:
Volume 53,
issue 6
页码: 4541-4543
ISSN:0021-8979
年代: 1982
DOI:10.1063/1.331200
出版商: AIP
数据来源: AIP
摘要:
The temperature dependence, over the 4.2–100 K range, of the narrow EPR line, labeledX, with an isotropic value ofg= 2.002 has been investigated in a semi‐insulating GaAs:Cr sample. From its Curie‐Weiss behavior, leading to a (T+13.1)−1law, it is concluded that it may result from antiferromagnetic exchange coupled spins, originating from dangling bonds located on extended defects present in the crystal.
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