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Electron paramagnetic resonance of extended defects in semi‐insulating GaAs

 

作者: A. Goltzene,   B. Meyer,   C. Schwab,  

 

期刊: Journal of Applied Physics  (AIP Available online 1982)
卷期: Volume 53, issue 6  

页码: 4541-4543

 

ISSN:0021-8979

 

年代: 1982

 

DOI:10.1063/1.331200

 

出版商: AIP

 

数据来源: AIP

 

摘要:

The temperature dependence, over the 4.2–100 K range, of the narrow EPR line, labeledX, with an isotropic value ofg= 2.002 has been investigated in a semi‐insulating GaAs:Cr sample. From its Curie‐Weiss behavior, leading to a (T+13.1)−1law, it is concluded that it may result from antiferromagnetic exchange coupled spins, originating from dangling bonds located on extended defects present in the crystal.

 

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