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Electron Microscope Studies on the Etching of Irradiated Germanium

 

作者: T. S. Noggle,   J. O. Stiegler,  

 

期刊: Journal of Applied Physics  (AIP Available online 1959)
卷期: Volume 30, issue 8  

页码: 1279-1288

 

ISSN:0021-8979

 

年代: 1959

 

DOI:10.1063/1.1735306

 

出版商: AIP

 

数据来源: AIP

 

摘要:

Electron microscope and electron diffraction studies on the surfaces of CP‐4 etched germanium specimens have shown that the changes in etching behavior induced by fast neutron irradiation occur as a result of a gross change in chemical behavior and cannot be due to local variations in the etching rate in the vicinity of the structural defects introduced by the irradiation. Observations on network structures which are produced under certain conditions of etching indicate that these arise as a result of mechanical preparation of the surfaces or from changes in the etching process and are apparently unrelated to any prior substructure in the material.

 

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