Electron Microscope Studies on the Etching of Irradiated Germanium
作者:
T. S. Noggle,
J. O. Stiegler,
期刊:
Journal of Applied Physics
(AIP Available online 1959)
卷期:
Volume 30,
issue 8
页码: 1279-1288
ISSN:0021-8979
年代: 1959
DOI:10.1063/1.1735306
出版商: AIP
数据来源: AIP
摘要:
Electron microscope and electron diffraction studies on the surfaces of CP‐4 etched germanium specimens have shown that the changes in etching behavior induced by fast neutron irradiation occur as a result of a gross change in chemical behavior and cannot be due to local variations in the etching rate in the vicinity of the structural defects introduced by the irradiation. Observations on network structures which are produced under certain conditions of etching indicate that these arise as a result of mechanical preparation of the surfaces or from changes in the etching process and are apparently unrelated to any prior substructure in the material.
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