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High‐resolution dc‐voltage‐biased ac conductance bridge for tunnel junction measurements

 

作者: M. V. Moody,   J. L. Paterson,   R. L. Ciali,  

 

期刊: Review of Scientific Instruments  (AIP Available online 1979)
卷期: Volume 50, issue 7  

页码: 903-908

 

ISSN:0034-6748

 

年代: 1979

 

DOI:10.1063/1.1135947

 

出版商: AIP

 

数据来源: AIP

 

摘要:

A simple, low‐cost conductance bridge circuit, which provides high‐resolution measurements ofdI/dVandd2I/dV2for a voltage‐biased load, is presented. A resolution indI/dVfor a 90‐&OHgr; tunnel junction of several parts in 105has been measured using a 35‐&mgr;V‐rms modulation level and a 1‐s postdetection time constant (Bn=0.25 Hz). The output impedance of the voltage source and the error in the conductance measurement are discussed. The output impedance of the circuit with an AD119 operational amplifier is 0.02 &OHgr;. A detailed discussion of Johnson‐Nyquist, tunnel junction, and amplifier noise is presented.

 

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