High‐resolution dc‐voltage‐biased ac conductance bridge for tunnel junction measurements
作者:
M. V. Moody,
J. L. Paterson,
R. L. Ciali,
期刊:
Review of Scientific Instruments
(AIP Available online 1979)
卷期:
Volume 50,
issue 7
页码: 903-908
ISSN:0034-6748
年代: 1979
DOI:10.1063/1.1135947
出版商: AIP
数据来源: AIP
摘要:
A simple, low‐cost conductance bridge circuit, which provides high‐resolution measurements ofdI/dVandd2I/dV2for a voltage‐biased load, is presented. A resolution indI/dVfor a 90‐&OHgr; tunnel junction of several parts in 105has been measured using a 35‐&mgr;V‐rms modulation level and a 1‐s postdetection time constant (Bn=0.25 Hz). The output impedance of the voltage source and the error in the conductance measurement are discussed. The output impedance of the circuit with an AD119 operational amplifier is 0.02 &OHgr;. A detailed discussion of Johnson‐Nyquist, tunnel junction, and amplifier noise is presented.
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