摘要:

Electron diffraction has become established as a research tool for studying the structure of surface layers and thin films, and it has now been used moderately extensively for this purpose for more than a third of a century. Yet its field of usefulness is not sharply separated from that of x rays. Both require material of considerable thickness. The ordinary electron‐diffraction techniques are not sensitive to a single layer of atoms on a crystal surface. This is precisely the sensitivity required to make electron diffraction an indispensable research tool. It is needed in surface physics and surface chemistry; in the most important application, it is needed to understand catalysis. Lacking this sensitivity, as it does now, electron diffraction is not a serious competitor of x‐ray diffraction in general usefulness, and it has no unique field as does neutron diffraction. It is often available as an occasionally used attachment of an electron microscope.

ISSN:0031-9228    

DOI:10.1063/1.3051686

出版商:AIP    

年代:1964

数据来源: AIP

摘要:

At a recent meeting on crystal growth and defect characterization, there were many researchers who expressed a need for more and better facilities for analytical work. To help fulfill this need, Charles F. Yost, director for materials science, Advanced Research Projects Agency, proposed that a symposium be arranged to present, in a consolidated fashion, the capabilities and limitations of available analytical resources, especially as they relate to materials problems in ARPA‐sponsored laboratories. The ensuing symposium, organized and held at RCA Laboratories was conducted in the spirit of a workshop or “clinic” with ample opportunity provided for discussion. There was an informality that resulted in considerable audience participation and interaction. The talks and discussions covered not only technical aspects of particular analytical procedures, but also the over‐all problem of effectively coupling analytical service to a materials research program.

ISSN:0031-9228    

DOI:10.1063/1.3051687

出版商:AIP    

年代:1964

数据来源: AIP

摘要:

Physics in America is flourishing; it is a robust active science and nothing makes that point better than the number, quality, and variety of researches being reported and discussed at this meeting. One sees progress in high‐energy particle physics, in theoretical physics, in nuclear‐structure physics, in studies of solids, in the renascent optics connected with lasers, as well as in other areas. Perhaps more than in the formal program, one feels its vitality in the youth of the participants, the little knots of intense people, earnestly engaged in sometimes excited discussion in the corridors and outside the formal meeting rooms. It is not hard to understand that physics in our country occupies a leading position in the world today.

ISSN:0031-9228    

DOI:10.1063/1.3051688

出版商:AIP    

年代:1964

数据来源: AIP

摘要:

The Tenth National Vacuum Symposium, sponsored by the American Vacuum Society, was held on October 16 to 18 in the Statler‐Hilton Hotel in Boston. The technical meeting, completing a decade of such symposia, was attended by fifteen hundred scientists, engineers, and related technical people. An additional eight hundred others visited the technical exhibits. The size of this meeting was a far cry from the first such assemblage at Asbury Park, which was sponsored by the originating Committee on Vacuum Techniques. In the intervening ten years since Asbury Park, this symposium has grown about tenfold in size, and the group has become an affiliate of the American Institute of Physics. The national symposium is the one meeting in which the technology of and phenomena associated with vacuum are brought together, reviewed, and the most recent advances discussed.

ISSN:0031-9228    

DOI:10.1063/1.3051689

出版商:AIP    

年代:1964

数据来源: AIP

ISSN:0031-9228    

DOI:10.1063/1.3051692

出版商:AIP    

年代:1964

数据来源: AIP

ISSN:0031-9228    

DOI:10.1063/1.3051694

出版商:AIP    

年代:1964

数据来源: AIP

ISSN:0031-9228    

DOI:10.1063/1.3051696

出版商:AIP    

年代:1964

数据来源: AIP

ISSN:0031-9228    

DOI:10.1063/1.3051698

出版商:AIP    

年代:1964

数据来源: AIP

ISSN:0031-9228    

DOI:10.1063/1.3051702

出版商:AIP    

年代:1964

数据来源: AIP

ISSN:0031-9228    

DOI:10.1063/1.3051703

出版商:AIP    

年代:1964

数据来源: AIP