Review of Scientific Instruments


ISSN: 0034-6748        年代:1984
当前卷期:Volume 55  issue 2     [ 查看所有卷期 ]

年代:1984
 
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11. Modifications to the Boonton 72BD capacitance meter for deep‐level transient spectroscopy applications
  Review of Scientific Instruments,   Volume  55,   Issue  2,   1984,   Page  200-203

T. I. Chappell,   C. M. Ransom,  

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12. Intelligent multichannel data‐acquisition system for pulsed laser applications
  Review of Scientific Instruments,   Volume  55,   Issue  2,   1984,   Page  204-209

L. M. Jones,   G. E. Leroi,   C. A. Myerholtz,   C. G. Enke,  

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13. Uniaxial stress apparatus for deep level transient spectroscopy studies
  Review of Scientific Instruments,   Volume  55,   Issue  2,   1984,   Page  210-212

C. D. Lamp,   J. W. Farmer,   J. M. Meese,  

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14. Heat switch for liquid‐helium temperatures
  Review of Scientific Instruments,   Volume  55,   Issue  2,   1984,   Page  213-215

J. P. Torre,   G. Chanin,  

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15. Quantitative real‐time schlieren system for ultrasound visualization
  Review of Scientific Instruments,   Volume  55,   Issue  2,   1984,   Page  216-221

B. Porter,  

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16. Field effect transistor tracking surface field sensor
  Review of Scientific Instruments,   Volume  55,   Issue  2,   1984,   Page  222-225

Mark N. Horenstein,  

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17. Keyed‐powder gun for the oblique‐impact shock study of solids in several 10 s of GPa region
  Review of Scientific Instruments,   Volume  55,   Issue  2,   1984,   Page  226-230

Tsutomu Mashimo,   Shinobu Ozaki,   Kunihito Nagayama,  

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18. Low‐temperature pressure variations in a self‐clamping pressure cell
  Review of Scientific Instruments,   Volume  55,   Issue  2,   1984,   Page  231-234

J. D. Thompson,  

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19. Simple high‐temperature thermal diffusivity apparatus
  Review of Scientific Instruments,   Volume  55,   Issue  2,   1984,   Page  235-237

C. Wood,   A. Zoltan,  

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20. Reactor for combined surface spectroscopic analysis and atmospheric pressure kinetic studies of catalysts
  Review of Scientific Instruments,   Volume  55,   Issue  2,   1984,   Page  238-243

Jeffrey J. Weimer,   Fredrick A. Putnam,  

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