Review of Scientific Instruments


ISSN: 0034-6748        年代:1984
当前卷期:Volume 55  issue 4     [ 查看所有卷期 ]

年代:1984
 
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11. Mirror electrode for laser initiated discharge channels
  Review of Scientific Instruments,   Volume  55,   Issue  4,   1984,   Page  503-507

R. M. Gilgenbach,   L. D. Horton,  

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12. Transmission grating velocimeter for particles electric mobility measurements
  Review of Scientific Instruments,   Volume  55,   Issue  4,   1984,   Page  508-513

E. Delatour,   M. Hanss,  

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13. Saturated absorption in a molecular gas mixture to find line frequencies
  Review of Scientific Instruments,   Volume  55,   Issue  4,   1984,   Page  514-515

J. W. R. Tabosa,   J. R. Rios Leite,  

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14. Cylindrical spinner and speed controller for magic angle spinning nuclear magnetic resonance
  Review of Scientific Instruments,   Volume  55,   Issue  4,   1984,   Page  516-520

James N. Lee,   D. W. Alderman,   Jiang Yi Jin,   Kurt W. Zilm,   Charles L. Mayne,   Ronald J. Pugmire,   David M. Grant,  

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15. Noise current measurements and signal‐to‐noise improvement in low‐temperature, low‐frequency nuclear‐magnetic‐resonance experiments
  Review of Scientific Instruments,   Volume  55,   Issue  4,   1984,   Page  521-526

J. Lepaisant,   D. Bloyet,   E. Varoquaux,  

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16. An efficient digital phase‐sensitive detector for use in electron‐spin‐resonance spectroscopy
  Review of Scientific Instruments,   Volume  55,   Issue  4,   1984,   Page  527-532

A. I. Vistnes,   D. I. Wormald,   S. Isachsen,   D. Schmalbein,  

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17. Errors due to field nonuniformity in vibrating sample magnetometry
  Review of Scientific Instruments,   Volume  55,   Issue  4,   1984,   Page  533-536

H. R. Kerchner,   S. T. Sekula,   J. R. Thompson,  

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18. Double focusing ion mass spectrometer of cylindrical symmetry
  Review of Scientific Instruments,   Volume  55,   Issue  4,   1984,   Page  537-541

M. A. Coplan,   John H. Moore,   R. A. Hoffman,  

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19. Ion scattering spectrometry in a commercial scanning Auger microprobe
  Review of Scientific Instruments,   Volume  55,   Issue  4,   1984,   Page  542-546

Zhixiong Liu,   David A. Reed,  

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20. Direct observation of electric field induced surface atomic displacements using the field ion microscope
  Review of Scientific Instruments,   Volume  55,   Issue  4,   1984,   Page  547-550

H. C. Eaton,   R. J. Bayuzick,  

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