Review of Scientific Instruments


ISSN: 0034-6748        年代:1994
当前卷期:Volume 65  issue 9     [ 查看所有卷期 ]

年代:1994
 
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21. A lateral modulation technique for simultaneous friction and topography measurements with the atomic force microscope
  Review of Scientific Instruments,   Volume  65,   Issue  9,   1994,   Page  2870-2873

T. Go¨ddenhenrich,   S. Mu¨ller,   C. Heiden,  

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22. The influences of roughness on film thickness measurements by Mueller matrix ellipsometry
  Review of Scientific Instruments,   Volume  65,   Issue  9,   1994,   Page  2874-2881

David A. Ramsey,   Kenneth C. Ludema,  

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23. In situcharacterization of plasma‐depositeda‐C:H thin films by spectroscopic infrared ellipsometry
  Review of Scientific Instruments,   Volume  65,   Issue  9,   1994,   Page  2882-2889

A. Friedl,   W. Fukarek,   W. Mo¨ller,   A. Koch,  

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24. Measurement of time‐resolved photoluminescence of semiconductors using correlational analysis
  Review of Scientific Instruments,   Volume  65,   Issue  9,   1994,   Page  2890-2893

T. Baier,   T. Walter,   G. Mauckner,   J. Schneider,   K. Thonke,   R. Sauer,  

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25. Material characterization using a frequency‐doubling two‐color interferometer
  Review of Scientific Instruments,   Volume  65,   Issue  9,   1994,   Page  2894-2895

Hirokazu Matsumoto,  

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26. Thermal diffusivity measurements using linear relations from photothermal wave experiments
  Review of Scientific Instruments,   Volume  65,   Issue  9,   1994,   Page  2896-2900

A. Salazar,   A. Sa´nchez‐Lavega,  

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27. An improved transient hot‐wire method for studying thermal transport in condensed matter
  Review of Scientific Instruments,   Volume  65,   Issue  9,   1994,   Page  2901-2907

H. Takahashi,   Y. Hiki,   Y. Kogure,  

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28. A flat flame burner as calibration source for combustion research: Temperatures and species concentrations of premixed H2/air flames
  Review of Scientific Instruments,   Volume  65,   Issue  9,   1994,   Page  2908-2911

S. Prucker,   W. Meier,   W. Stricker,  

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29. A noncontact cryogenic microwave measurement system for superconducting device characterization
  Review of Scientific Instruments,   Volume  65,   Issue  9,   1994,   Page  2912-2915

Alp T. Findikoglu,   T. Nakamura,   H. Tokuda,   M. Iiyama,  

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30. A high inductance kHz resonator with a quality factor larger than 106
  Review of Scientific Instruments,   Volume  65,   Issue  9,   1994,   Page  2916-2919

P. Falferi,   M. Cerdonio,   L. Franceschini,   R. Macchietto,   S. Vitale,   J. P. Zendri,  

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