Review of Scientific Instruments


ISSN: 0034-6748        年代:1998
当前卷期:Volume 69  issue 1     [ 查看所有卷期 ]

年代:1998
 
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31. Signal generation mechanisms, intracavity-gas thermal-diffusivity temperature dependence, and absolute infrared emissivity measurements in a thermal-wave resonant cavity
  Review of Scientific Instruments,   Volume  69,   Issue  1,   1998,   Page  197-203

Jun Shen,   Andreas Mandelis,   Helen Tsai,  

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32. Projection x-ray microscope powered by highly charged ions
  Review of Scientific Instruments,   Volume  69,   Issue  1,   1998,   Page  204-209

R. E. Marrs,   D. H. Schneider,   J. W. McDonald,  

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33. Factors governing the discharge of electrostatic mirror formations in the scanning electron microscope
  Review of Scientific Instruments,   Volume  69,   Issue  1,   1998,   Page  210-214

W. K. Wong,   J. T. L. Thong,   J. C. H. Phang,  

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34. Battery-operated atomic force microscope
  Review of Scientific Instruments,   Volume  69,   Issue  1,   1998,   Page  215-220

Burford J. Furman,   Joseph Christman,   Michael Kearny,   Frank Wojcik,   Marco Tortonese,  

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35. A scanning force microscope with atomic resolution in ultrahigh vacuum and at low temperatures
  Review of Scientific Instruments,   Volume  69,   Issue  1,   1998,   Page  221-225

W. Allers,   A. Schwarz,   U. D. Schwarz,   R. Wiesendanger,  

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36. Three-dimensional displacements of a piezoelectric tube scanner
  Review of Scientific Instruments,   Volume  69,   Issue  1,   1998,   Page  226-229

Shengyuan Yang,   Wenhao Huang,  

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37. A Petri cell modified for atomic force microscopy suitable to investigate biological samples in liquid
  Review of Scientific Instruments,   Volume  69,   Issue  1,   1998,   Page  230-232

Antonio Cricenti,   Renato Generosi,  

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38. Measurement of sensitivity distributions of capacitance tomography sensors
  Review of Scientific Instruments,   Volume  69,   Issue  1,   1998,   Page  233-236

W. Q. Yang,   W. F. Conway,  

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39. A modification of A˚ngstro¨m’s method that employs photothermal radiometry to measure thermal diffusivity: Application to chemical vapor deposited diamond
  Review of Scientific Instruments,   Volume  69,   Issue  1,   1998,   Page  237-243

A. Feldman,   N. M. Balzaretti,  

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40. Determination of parameters of deep level defects from numerical fit of deep level transient spectroscopy spectra: Analysis of accuracy and sensitivity to noise
  Review of Scientific Instruments,   Volume  69,   Issue  1,   1998,   Page  244-250

A. A. Istratov,   H. Hieslmair,   C. Flink,   E. R. Weber,  

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