Review of Scientific Instruments


ISSN: 0034-6748        年代:1994
当前卷期:Volume 65  issue 11     [ 查看所有卷期 ]

年代:1994
 
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1. Signal‐to‐noise ratio in lock‐in amplifier synchronous detection: A generalized communications systems approach with applications to frequency, time, and hybrid (rate window) photothermal measurements
  Review of Scientific Instruments,   Volume  65,   Issue  11,   1994,   Page  3309-3323

Andreas Mandelis,  

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2. A powerful eyesafe infrared aerosol lidar: Application of stimulated Raman backscattering of 1.06 &mgr;m radiation
  Review of Scientific Instruments,   Volume  65,   Issue  11,   1994,   Page  3324-3331

W. Carnuth,   T. Trickl,  

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3. Construction of a time‐frequency two‐dimensional multiplex coherent anti‐Stokes Raman scattering spectrometer having 15 ps time resolution
  Review of Scientific Instruments,   Volume  65,   Issue  11,   1994,   Page  3332-3338

Tahei Tahara,   Hiro‐o Hamaguchi,  

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4. A new continuum‐source atomic absorption spectrometer
  Review of Scientific Instruments,   Volume  65,   Issue  11,   1994,   Page  3339-3343

David T. Williams,   Alex E. S. Green,  

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5. A new‐regime Wiley–McLaren time‐of‐flight mass spectrometer
  Review of Scientific Instruments,   Volume  65,   Issue  11,   1994,   Page  3344-3353

F. Chandezon,   B. Huber,   C. Ristori,  

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6. A personal computer‐based nuclear magnetic resonance spectrometer
  Review of Scientific Instruments,   Volume  65,   Issue  11,   1994,   Page  3354-3362

Constantin Job,   Robert M. Pearson,   Michael F. Brown,  

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7. Multigap parallel‐plate bracelet resonator frequency determination and applications
  Review of Scientific Instruments,   Volume  65,   Issue  11,   1994,   Page  3363-3366

Patrick Gonord,   Siew Kan,   Anne Leroy‐Willig,   Claire Wary,  

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8. Confocal theta microscope with three objective lenses
  Review of Scientific Instruments,   Volume  65,   Issue  11,   1994,   Page  3367-3372

Steffen Lindek,   Rainer Pick,   Ernst H. K. Stelzer,  

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9. An atomic‐resolution cryogenic scanning tunneling microscope
  Review of Scientific Instruments,   Volume  65,   Issue  11,   1994,   Page  3373-3377

X. Chen,   E. R. Frank,   R. J. Hamers,  

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10. Sampled waveform measurement in integrated circuits using heterodyne electrostatic force microscopy
  Review of Scientific Instruments,   Volume  65,   Issue  11,   1994,   Page  3378-3381

G. E. Bridges,   R. A. Said,   M. Mittal,   D. J. Thomson,  

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