Review of Scientific Instruments


ISSN: 0034-6748        年代:1979
当前卷期:Volume 50  issue 8     [ 查看所有卷期 ]

年代:1979
 
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1. Neutron diagnostics for pulsed high‐density thermonuclear plasmas
  Review of Scientific Instruments,   Volume  50,   Issue  8,   1979,   Page  941-948

C. A. Ekdahl,  

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2. A fast‐scanning heterodyne receiver for measurement of the electron cyclotron emission from high‐temperature plasmas
  Review of Scientific Instruments,   Volume  50,   Issue  8,   1979,   Page  949-951

P. C. Efthimion,   V. Arunasalam,   R. Bitzer,   L. Campbell,   J. C. Hosea,  

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3. Measurement of turbulent fluctuations in high‐speed flows using hot wires and hot films
  Review of Scientific Instruments,   Volume  50,   Issue  8,   1979,   Page  952-957

Mukund Acharya,  

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4. High‐energy optically pumped molecular lasers in the 13‐ and 16‐&mgr;m regions
  Review of Scientific Instruments,   Volume  50,   Issue  8,   1979,   Page  958-961

J. J. Tiee,   T. A. Fischer,   C. Wittig,  

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5. Glass windows for hydrostatic pressures of 45 kbar
  Review of Scientific Instruments,   Volume  50,   Issue  8,   1979,   Page  962-963

A. Lavergne,   E. Whalley,  

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6. Recent studies of float and stall curves in controlled‐clearance deadweight testers with a simple piston
  Review of Scientific Instruments,   Volume  50,   Issue  8,   1979,   Page  964-968

D. H. Newhall,   I. Ogawa,   V. Zilberstein,  

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7. A microprocessor‐controlled photon counter for pulsed optically detected magnetic resonance
  Review of Scientific Instruments,   Volume  50,   Issue  8,   1979,   Page  969-971

R. K. Power,   A. M. Nishimura,  

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8. Vacuum photodiode detector array for broadband UV detection in a tokamak plasma
  Review of Scientific Instruments,   Volume  50,   Issue  8,   1979,   Page  972-978

S. J. Zweben,   C. R. Menyuk,   R. J. Taylor,  

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9. Automatic measurement of temperature in a nuclear reactor
  Review of Scientific Instruments,   Volume  50,   Issue  8,   1979,   Page  979-982

A. Youssefkhani,  

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10. Novel variable‐temperature chuck for use in the detection of deep levels in processed semiconductor wafers
  Review of Scientific Instruments,   Volume  50,   Issue  8,   1979,   Page  983-987

R. Y. Koyama,   M. G. Buehler,  

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