Integrated Ferroelectrics


ISSN: 1058-4587        年代:1993
当前卷期:Volume 3  issue 4     [ 查看所有卷期 ]

年代:1993
 
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1. Anomalous fatigue behavior in Zn doped PZT
  Integrated Ferroelectrics,   Volume  3,   Issue  4,   1993,   Page  293-300

B.M. Melnick,   M.C. Scott,   C.A. Paz De Araujo,   L.D. McMillan,   T. Mihara,  

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2. Ferroelectric ceramics and thin films for pyroelectric applications
  Integrated Ferroelectrics,   Volume  3,   Issue  4,   1993,   Page  301-308

D.A. Tossell,   N.M. Shorrocks,   R.W. Whatmore,  

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3. Measurement and simulation of partial switching in ferroelectric PZT thin-films
  Integrated Ferroelectrics,   Volume  3,   Issue  4,   1993,   Page  309-320

LawrenceT. Clark,   Terje Gloerstad,   RobertO. Grondin,   SandwipK. Dey,  

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4. Electrodes for ferroelectric thin films
  Integrated Ferroelectrics,   Volume  3,   Issue  4,   1993,   Page  321-332

H.N. Al-Shareef,   K.D. Gifford,   S.H. Rou,   P.D. Hren,   O. Auciello,   A.I. Kingon,  

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5. An aqueous, low temperature process for synthesizing PZT(53,47) thin films
  Integrated Ferroelectrics,   Volume  3,   Issue  4,   1993,   Page  333-341

Chhiu-Tsu Lin,   Li Li,   JeffreyS. Webb,   RussellA. Lipeles,   MartinS. Leung,  

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6. Aging and fatigue in bulk ferroelectric perovskite ceramics
  Integrated Ferroelectrics,   Volume  3,   Issue  4,   1993,   Page  343-349

G. Arlt,   U. Robels,  

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7. A theory of polarization reversals in finite systems
  Integrated Ferroelectrics,   Volume  3,   Issue  4,   1993,   Page  351-354

Yoshihiro Ishibashi,  

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8. Characterization of conduction in PZT thin films produced by laser ablation deposition
  Integrated Ferroelectrics,   Volume  3,   Issue  4,   1993,   Page  355-363

X. Chen,   A.I. Kingon,   L. Mantese,   O. Auciello,   K.Y. Hsieh,  

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9. Electrochemical models of failure in oxide perovskites
  Integrated Ferroelectrics,   Volume  3,   Issue  4,   1993,   Page  365-376

SeshuB. Desu,   InK. Yoo,  

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10. May-leonard oscillations in ferroelectric thermal lenses
  Integrated Ferroelectrics,   Volume  3,   Issue  4,   1993,   Page  377-382

J.F. Scott,   T. Chen,   P.E. Phillipson,  

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