摘要:

Dielectric post resonances are investigated using a combination of the finite and boundary element methods (CFBEM). A substructure method is adopted in the finite-element method (FEM), so the dimension of the matrix equation to be solved can be reduced. Some of the lossless dielectric post resonances in a rectangular waveguide can be physically realised by a lattice circuit, and it is found that there are two types of dielectric post resonances. Moreover, the variations of the post location are related to the variations of the branch reactances of the lattice circuit.

DOI:10.1049/ip-h-2.1990.0011

出版商:IEE    

年代:1990

数据来源: IET

摘要:

The design of a 2–18 GHz dual six-port network analyser which replaces auxiliary equipment such as scanners and voltmeters employed in other designs with computer integrated electronic circuits is described. The system is fully automatic. Its calibration and measurement procedures are based on the ‘thru-reflectline’ method, reducing operator involvement to a minimum. Tests show the newly developed system combines attributes of speed and accuracy and indicate the device may be suitable for general purpose measurement applications.

DOI:10.1049/ip-h-2.1990.0012

出版商:IEE    

年代:1990

数据来源: IET

摘要:

The interference of an electromagnetic pulse incident on the air-dielectric interface of a three-layer model for microstrip circuits was studied. Numerical results illustrating the power absorption by the model as a function of indicent angle and width of the pulse are presented. It is found that less than 1% of the power of the incident pulse can be absorbed by the substrate material. However, about 80% of the power of the incident pulse can be induced on the air-dielectric interface during the reflection of the pulse by the boundary. This amount of power flowing on the surface of the circuit can cause malfunctions or interference if the incident EMP has sufficiently intense wave fields'.

DOI:10.1049/ip-h-2.1990.0013

出版商:IEE    

年代:1990

数据来源: IET

摘要:

A theoretical model of an empty-cavity signal arising from the microwave Hall-effect in the cavity end walls is developed using theS-matrix approach. This unwanted signal is given in terms of the geometry of a critically coupled rectangular bimodal microwave cavity. An expression for the Hall mobility of metals forming the cavity end walls is formulated extending the application of the microwave Hall measurement technique into the area of high conductivity materials.

DOI:10.1049/ip-h-2.1990.0014

出版商:IEE    

年代:1990

数据来源: IET