11. |
Sinnultaneous Confidence Ellipsoids in the General Linear Model |
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Technometrics,
Volume 18,
Issue 1,
1976,
Page 85-87
RobertE. Tarone,
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摘要:
An elementary derivation is given for simultaneous confidence ellipsoids for all subsets of a given set of linearly independent estimable functions in the general linear model. The relationship between the ellipsoids and Scheffé's method is developed. A method is provided to determine which subsets will yield contrasts which differ significantly from zero by Scheffé's method.
ISSN:0040-1706
DOI:10.1080/00401706.1976.10489404
出版商:Taylor & Francis Group
年代:1976
数据来源: Taylor
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12. |
Comparison of Four Procedures for Multiple Comparisons Among Means (Pairwise Contrasts) for Arbitrary Sample Sizes |
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Technometrics,
Volume 18,
Issue 1,
1976,
Page 89-97
HansK. Ury,
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ISSN:0040-1706
DOI:10.1080/00401706.1976.10489405
出版商:Taylor & Francis Group
年代:1976
数据来源: Taylor
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13. |
Progressively Censored Sampling in the Three Parameter Log-Normal Distribution |
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Technometrics,
Volume 18,
Issue 1,
1976,
Page 99-103
A.Clifford Cohen,
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PDF (474KB)
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摘要:
This paper is an extension of previous work by the writer concerning progressively censored sampling in the normal distribution [4] and in the Weibull distribution [6]. Here local maximum likelihood estimators and estimators which utilize the first order statistic are derived for the three-parameter log-normal distribution when samples are progressively censored. An illustrative example involving life test data is incli ded. Various properties of the proposed estimators are investigated.
ISSN:0040-1706
DOI:10.1080/00401706.1976.10489406
出版商:Taylor & Francis Group
年代:1976
数据来源: Taylor
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14. |
Theory for Optimum Censored Accelerated Life Tests for Normal and Lognormal Life Distributions |
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Technometrics,
Volume 18,
Issue 1,
1976,
Page 105-114
Wayne Nelson,
ThomasJ. Kielpinski,
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摘要:
This expository paper presents theory for optimum plans for accelerated life tests for estimating a simple linear relationship between a stress and product life, which has a normal or lognormal distribution, when the data are to be analyzed before all test units fail. Standard plans with equal numbers of test units at equally spaced test stresses are presented and are compared with the optimum plans. While the optimllm plans may not always be robust enough in practice, they indicate that more test units should be run at low stress than at high stress. The plans are illustrated with a temperatllre-accelersted life test of an electrical insulation analyzed with the Arrhenius model.
ISSN:0040-1706
DOI:10.1080/00401706.1976.10489407
出版商:Taylor & Francis Group
年代:1976
数据来源: Taylor
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15. |
Confidence Bounds on the Parameters of the Weibull Process |
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Technometrics,
Volume 18,
Issue 1,
1976,
Page 115-117
J.M. Finkelstein,
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ISSN:0040-1706
DOI:10.1080/00401706.1976.10489408
出版商:Taylor & Francis Group
年代:1976
数据来源: Taylor
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16. |
Comparative Statistical Inference |
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Technometrics,
Volume 18,
Issue 1,
1976,
Page 119-120
AustinJ. Bonis,
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PDF (286KB)
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ISSN:0040-1706
DOI:10.1080/00401706.1976.10489409
出版商:Taylor & Francis Group
年代:1976
数据来源: Taylor
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17. |
Elementary Statistics |
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Technometrics,
Volume 18,
Issue 1,
1976,
Page 120-121
J.E. J.,
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PDF (293KB)
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ISSN:0040-1706
DOI:10.1080/00401706.1976.10489410
出版商:Taylor & Francis Group
年代:1976
数据来源: Taylor
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18. |
Time Series Data Analysis and Theory |
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Technometrics,
Volume 18,
Issue 1,
1976,
Page 121-121
EdwardJ. Wrgman,
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PDF (143KB)
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ISSN:0040-1706
DOI:10.1080/00401706.1976.10489411
出版商:Taylor & Francis Group
年代:1976
数据来源: Taylor
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19. |
Developments in Field Experiment Design and Analysis |
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Technometrics,
Volume 18,
Issue 1,
1976,
Page 122-123
J.E. J.,
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PDF (215KB)
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ISSN:0040-1706
DOI:10.1080/00401706.1976.10489413
出版商:Taylor & Francis Group
年代:1976
数据来源: Taylor
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20. |
Amendment |
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Technometrics,
Volume 18,
Issue 1,
1976,
Page 123-123
I.J. Good,
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PDF (79KB)
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ISSN:0040-1706
DOI:10.1080/00401706.1976.10489414
出版商:Taylor & Francis Group
年代:1976
数据来源: Taylor
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