Technometrics


ISSN: 0040-1706        年代:1980
当前卷期:Volume 22  issue 1     [ 查看所有卷期 ]

年代:1980
 
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11. A Test of Exponentiality Based on the Bivariate F Distribution
  Technometrics,   Volume  22,   Issue  1,   1980,   Page  79-82

Chine-Chuong Lin,   GovindS. Mudholkar,  

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12. An Accurate Approximation to the Sampling Distribution of the Studentized Extreme Value Statistic
  Technometrics,   Volume  22,   Issue  1,   1980,   Page  83-97

K.W. Fertig,   NancyR. Mann,  

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13. A Reliability Distribution With Increasing, Decreasing, Constant and Bathtub-Shaped Failure Rates
  Technometrics,   Volume  22,   Issue  1,   1980,   Page  99-107

Urban Hjorth,  

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14. Some Fundamental Properties of Kolmogorov-Smirnov Consonance Sets
  Technometrics,   Volume  22,   Issue  1,   1980,   Page  109-111

AnthonyA. Salvia,  

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15. Ranking (Ordering) and Selection: An Overview of How to Select the Best
  Technometrics,   Volume  22,   Issue  1,   1980,   Page  113-119

EdwardJ. Dudewicz,  

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16. Awardee Selection Procedures, With Special Reference to the Frank Wilcoxon and Jack Youden Prizes
  Technometrics,   Volume  22,   Issue  1,   1980,   Page  121-128

YoungJack lee,   EdwardJ. Dudewicz,  

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17. Is the Regression Equation Adequate?—A Further Note
  Technometrics,   Volume  22,   Issue  1,   1980,   Page  125-126

Ronald Suich,   GeorgeC. Derringer,  

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18. Is the Regression Equation Adequate?—A Reply
  Technometrics,   Volume  22,   Issue  1,   1980,   Page  127-128

R.Carter Hill,   GeorgeG. Judge,   ThomasB. Fomby,  

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19. Exploratory Data Analysis
  Technometrics,   Volume  22,   Issue  1,   1980,   Page  129-130

J.T. Smiih,   M.P. Griffin,  

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20. Linear Regression Analysis
  Technometrics,   Volume  22,   Issue  1,   1980,   Page  130-130

DouglasC. Cracker,  

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