11. |
The OC and ASN Functions of Some SPRT's for the Correlation Coefficient |
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Technometrics,
Volume 13,
Issue 4,
1971,
Page 833-841
CharlesJ. Kowalski,
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摘要:
The use of Wald's SPRT to test hypotheses concerning the correlation coefficient is complicated by the nuisance parameters (μx, μy, σX, σy) in the bivariate normal density function. While more general theories have been proposed to produce sequential tests in such situations, the properties of these tests are difficult to ascertain since Wald's method of approximating the OC and ASN functions (usually) breaks down. We derive several sequential tests for the correlation coefficient for which these functions are calculable.
ISSN:0040-1706
DOI:10.1080/00401706.1971.10488853
出版商:Taylor & Francis Group
年代:1971
数据来源: Taylor
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12. |
On Selecting the Most Probable Category |
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Technometrics,
Volume 13,
Issue 4,
1971,
Page 843-850
Khursheed Alam,
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PDF (438KB)
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摘要:
A sequential procedure is given for selecting from a given multinomial distribution withkcells, the cell with the largest probability, which is called the “most probable” category. Observations being taken sequentially from the given distribution, the sampling is terminated when the difference between the highest and the next highest cell counts is equal to a positive integerr. The cell with the highest count when the sampling is terminated, is selected as the most probable category. It is shown that the sampling terminates with probability 1. The probability of a correct selection and the expected total number of observations are given. The given procedure is compared with other known procedures.
ISSN:0040-1706
DOI:10.1080/00401706.1971.10488854
出版商:Taylor & Francis Group
年代:1971
数据来源: Taylor
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13. |
Monotonicity Properties of the Moments of Truncated Gamma and Weibull Density Functions |
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Technometrics,
Volume 13,
Issue 4,
1971,
Page 851-857
AlanJ. Gross,
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摘要:
Moments of truncated Weibull and gamma density functions exhibit monotonicity properties with respect to the parameters of these density functions under the assumption of a known truncation value. Using these properties, we then apply the melhod of moments criterion to get estimates of the parameter of the truncated exponential density function.
ISSN:0040-1706
DOI:10.1080/00401706.1971.10488855
出版商:Taylor & Francis Group
年代:1971
数据来源: Taylor
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14. |
Point Estimation of Reliability of a System Comprised ofkElements from the Same Gamma Model |
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Technometrics,
Volume 13,
Issue 4,
1971,
Page 859-864
J.K. Wani,
D.G. Kabe,
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PDF (339KB)
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摘要:
Unbiased minimum variance estimates of reliability are obtained for series, parallel, and standby redundant systems when the components are from a single Gamma distribution with known shape parameter and unknown scale parameter. The results obtained here generalize some of the results of Rutemiller [9] for the exponential model.
ISSN:0040-1706
DOI:10.1080/00401706.1971.10488856
出版商:Taylor & Francis Group
年代:1971
数据来源: Taylor
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15. |
Approximate Fiducial Bounds for the Reliability of a Series System for Which Each Component has an Exponential Time-to-Fail Distribution |
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Technometrics,
Volume 13,
Issue 4,
1971,
Page 865-871
FrankE. Grubbs,
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PDF (408KB)
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摘要:
The computation of exact confidence limits on the reliability of systems using sample data on components turns out to be a very involved process or one requiring very extensive Monte Carlo runs on computers. We suggest here a simple, straight-forward procedure for approximating the fiducial probability bounds on the true system reliability which may be used as approximations to confidence bounds for the reliability of a series system for which each component has an exponential time-to-fail distribution.
ISSN:0040-1706
DOI:10.1080/00401706.1971.10488857
出版商:Taylor & Francis Group
年代:1971
数据来源: Taylor
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16. |
Approximate Fiducial Bounds on Reliability for the Two Parameter Negative Exponential Distribution |
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Technometrics,
Volume 13,
Issue 4,
1971,
Page 873-876
FrankE. Grubbs,
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摘要:
We suggest herein a procedure for finding approximate fiducial bounds on the true reliability for the two parameter negative exponential distribution, which may be used as approximate “confidence” limits on reliability. These limits are simple and easy to compute. Also, they reduce to the exact confidence limits for the case of the single parameter negative exponential distribution.
ISSN:0040-1706
DOI:10.1080/00401706.1971.10488858
出版商:Taylor & Francis Group
年代:1971
数据来源: Taylor
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17. |
The Application of Exponential Smoothing to Reliability Assessment |
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Technometrics,
Volume 13,
Issue 4,
1971,
Page 877-883
AlanJ. Gross,
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PDF (396KB)
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摘要:
Consider a complex subsystem such as a missile which undergoes testing in stages. That is, the subsystem is testednitimes withxirecorded successes at thei-th stage of testing. The reliability of thei-th stage is estimated asri=xi/ni. In this paper, exponential smoothing is used to assess the overall reliability of the subsystem at the end of each stage of testing. That is, fii, the overall reliability at thei-th stage of testing is related to the reliabilities at the earlier stages by the equation Ri= αiri+ (1 – αi)Ri–1where Ri–1is the overall reliability at the (i– 1)-th stage and αi∊ [0, l] is thei-th stage smoothing constant. Methodology (Bayesian and empirical) is developed to determine, objectively, estimates of the smoothing constants.
ISSN:0040-1706
DOI:10.1080/00401706.1971.10488859
出版商:Taylor & Francis Group
年代:1971
数据来源: Taylor
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18. |
A Confidence Interval for the Lognormal Hazard |
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Technometrics,
Volume 13,
Issue 4,
1971,
Page 885-888
C.F. Jones,
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ISSN:0040-1706
DOI:10.1080/00401706.1971.10488860
出版商:Taylor & Francis Group
年代:1971
数据来源: Taylor
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19. |
A Note on Shortest Prediction Intervals for Log-Linear Regression |
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Technometrics,
Volume 13,
Issue 4,
1971,
Page 889-894
AlastairJ. Scott,
MichaelJ. Symons,
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PDF (1849KB)
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ISSN:0040-1706
DOI:10.1080/00401706.1971.10488861
出版商:Taylor & Francis Group
年代:1971
数据来源: Taylor
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20. |
A Comment on Ridge Regression. Biased Estimation for Non-Orthogonal Problems |
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Technometrics,
Volume 13,
Issue 4,
1971,
Page 895-898
K.S. Banerjee,
R.N. Carr,
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PDF (262KB)
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摘要:
In a recent issue ofTechnometrics, Hoer1 and Kennard [l] presented a comprehensive discussion of the problem of biased estimation in multiple regression that fits into the general linear hypothesis model of full rank. An alternative characterization of the form of the biased estimator has been presented in this note, and an “existence theorem” proven indicating that there exists aksuch that the biased estimation based on the proposed characterization would still lead to increased accuracy.
ISSN:0040-1706
DOI:10.1080/00401706.1971.10488862
出版商:Taylor & Francis Group
年代:1971
数据来源: Taylor
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