Technometrics


ISSN: 0040-1706        年代:1979
当前卷期:Volume 21  issue 2     [ 查看所有卷期 ]

年代:1979
 
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11. Prediction Limits and Two-Sample Problems with Complete or Censored Weibull Data
  Technometrics,   Volume  21,   Issue  2,   1979,   Page  233-237

Max Engelhardt,   LeeJ. Bain,  

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12. Comparison of Three Methods for Selecting Values of Input Variables in the Analysis of Output from a Computer Code
  Technometrics,   Volume  21,   Issue  2,   1979,   Page  239-245

M.D. McKay,   R.J. Beckman,   W.J. Conover,  

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13. Bayesian Results for the Inverse Gaussian Distribution with an Application
  Technometrics,   Volume  21,   Issue  2,   1979,   Page  247-251

AsitK. Banerjee,   G.K. Bhattacharyya,  

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14. Hotelling's TM2for Principal Components—What About Absolute Values?
  Technometrics,   Volume  21,   Issue  2,   1979,   Page  253-255

J.Edward Jackson,   F.Terry Hearne,  

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15. Structural identifiability for Compartmental Models
  Technometrics,   Volume  21,   Issue  2,   1979,   Page  257-259

David Grifliths,  

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16. Some Exact Percentage Points of a Statistic Useful in Analysis of Variance and Principal Component Analysis
  Technometrics,   Volume  21,   Issue  2,   1979,   Page  261-263

W.J. Krzanowski,  

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17. A Simplified Algorithm for the W Transformation in Variance Component Estimation
  Technometrics,   Volume  21,   Issue  2,   1979,   Page  265-267

J.H. Goodnight,   W.J. Hemmerle,  

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18. Orthogonal Main-Effect Plans for Asymmetrical Factorials
  Technometrics,   Volume  21,   Issue  2,   1979,   Page  269-270

Annie Chacko,   A. Dey,   G.V.S. Ramakrishna,  

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19. Regression Analysis by Example
  Technometrics,   Volume  21,   Issue  2,   1979,   Page  271-272

GeraldJ. Hahn,  

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20. Nonparametrics: Statistical Methods Based on Ranks
  Technometrics,   Volume  21,   Issue  2,   1979,   Page  272-273

MitchellJ. Mergenthaler,  

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