Technometrics


ISSN: 0040-1706        年代:1973
当前卷期:Volume 15  issue 1     [ 查看所有卷期 ]

年代:1973
 
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11. Response Surface Optimization when Experimental Factors are Subject to Costs and Constraints
  Technometrics,   Volume  15,   Issue  1,   1973,   Page  113-123

NelsonB. Heller,   GlennE. Staats,  

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12. Best Tests for Zero Drift Based on First Passage Times in Brownian Motion
  Technometrics,   Volume  15,   Issue  1,   1973,   Page  125-132

Arthur Nádas,  

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13. Linear Estimation of a Regression Relationship from Censored Data—Part II Best Linear Unbiased Estimation and Theory
  Technometrics,   Volume  15,   Issue  1,   1973,   Page  133-150

Wayne Nelson,   GeraldJ. Hahn,  

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14. A Dual Purpose Cost Based Quality Control System
  Technometrics,   Volume  15,   Issue  1,   1973,   Page  151-166

J.W. Schmidt,   R.E. Taylor,  

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15. Detection of Failure Rate Increases
  Technometrics,   Volume  15,   Issue  1,   1973,   Page  167-175

G. Lorden,   I. Eisenberger,  

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16. On a Test for the Equality of Two Exponential Distributions
  Technometrics,   Volume  15,   Issue  1,   1973,   Page  177-182

DavidG. Weinman,   Gene Dugger,   W.E. Franck,   JohnE. Hewett,  

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17. On the Performance of Power of Tests for the Comparison of Exponential Distributions
  Technometrics,   Volume  15,   Issue  1,   1973,   Page  183-186

SatyaD. Dubey,  

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18. Double Sample Tests for Hypotheses about the Mean of an Exponential Distribution
  Technometrics,   Volume  15,   Issue  1,   1973,   Page  187-190

WilliamG. Bulgren,   JohnE. Hewett,  

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19. Determination of Number of Failures to Control Risks of Erroneous Judgments in Exponential Life Testing
  Technometrics,   Volume  15,   Issue  1,   1973,   Page  191-193

FrankE. Grubbs,  

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20. Principles of Econometrics
  Technometrics,   Volume  15,   Issue  1,   1973,   Page  195-196

E.J. Hannan,  

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