Technometrics


ISSN: 0040-1706        年代:1973
当前卷期:Volume 15  issue 4     [ 查看所有卷期 ]

年代:1973
 
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21. Sample Sizes Required for Two-Sided Comparisons of Two Treatments With a Control
  Technometrics,   Volume  15,   Issue  4,   1973,   Page  915-921

F.E. Steffens,   Rosalie de Villiers,  

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22. Discrimination Between the Log-Normal and the Weibull Distributions
  Technometrics,   Volume  15,   Issue  4,   1973,   Page  923-926

Robert Dumonceaux,   CharlesE. Antle,  

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23. Weibull Skewness and Kurtosis as a Function of the Shape Parameter
  Technometrics,   Volume  15,   Issue  4,   1973,   Page  927-930

DwightN. Rousu,  

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24. Control Chart Constants for Largest and Smallest In Sampling from a Normal Distribution Using the Generalized Burr Distribution
  Technometrics,   Volume  15,   Issue  4,   1973,   Page  931-933

JohnA. Austin,  

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25. Statistics of Directional Data
  Technometrics,   Volume  15,   Issue  4,   1973,   Page  935-936

G.S. Watson,  

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26. Response Surface Methodology
  Technometrics,   Volume  15,   Issue  4,   1973,   Page  936-938

A.R. Manson,  

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27. Introduction to Bayesian Inference and Decision
  Technometrics,   Volume  15,   Issue  4,   1973,   Page  938-939

PaulW. Holland,  

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28. Engineering Statistics, 2nd edition
  Technometrics,   Volume  15,   Issue  4,   1973,   Page  939-940

J.T. Webster,  

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29. The Evaluation of Information Services and Products
  Technometrics,   Volume  15,   Issue  4,   1973,   Page  940-941

RobertM. Hayes,  

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30. Probability and Mathematical Statistics-An Introduction
  Technometrics,   Volume  15,   Issue  4,   1973,   Page  941-942

CharlesE. Land,  

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