Technometrics


ISSN: 0040-1706        年代:1973
当前卷期:Volume 15  issue 2     [ 查看所有卷期 ]

年代:1973
 
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1. Least Squares Estimation for a Class of Non-Linear Models
  Technometrics,   Volume  15,   Issue  2,   1973,   Page  209-218

Irwin Guttman,   Victor Pereyra,   HugoD. Scolnik,  

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2. Choosing a Nonlinear Predictor
  Technometrics,   Volume  15,   Issue  2,   1973,   Page  219-231

JudithZeh Nelson,   JohnW. Van Ness,  

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3. The Estimation of Parameters in Nonlinear, Implicit Models
  Technometrics,   Volume  15,   Issue  2,   1973,   Page  233-247

H.I. Britt,   R.H. Luecke,  

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4. Fiducial, Frequency, and Bayesian Inference on Reliability for the Two Parameter Negative Exponential Distribution
  Technometrics,   Volume  15,   Issue  2,   1973,   Page  249-253

DonaldA. Pierce,  

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5. The Transient Reliability Behavior of Series Systems or Superimposed Renewal Processes
  Technometrics,   Volume  15,   Issue  2,   1973,   Page  255-269

S. Blumenthal,   J.A. Greenwood,   L. Herbach,  

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6. Estimation in Compound Exponential Failure Models–When the Data are Grouped
  Technometrics,   Volume  15,   Issue  2,   1973,   Page  271-277

ThomasJ. Boardman,  

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7. Results for One or More Independent Censored Samples from the Weibull or Extreme-Value Distribution
  Technometrics,   Volume  15,   Issue  2,   1973,   Page  279-288

LeeJ. Bain,  

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8. Inference from Accelerated Life Tests Using Arrhenius Type Re-Parameterizations
  Technometrics,   Volume  15,   Issue  2,   1973,   Page  289-299

NozerD. Singpurwalla,  

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9. Response Surface Techniques for Dual Response Systems
  Technometrics,   Volume  15,   Issue  2,   1973,   Page  301-317

RaymondH. Myers,   WalterH. Carter,  

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10. Secondary Criteria in the Selection of Minimum Bias Designs in Two Variables
  Technometrics,   Volume  15,   Issue  2,   1973,   Page  319-328

WilliamO. Thompson,  

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