Technometrics


ISSN: 0040-1706        年代:1992
当前卷期:Volume 34  issue 2     [ 查看所有卷期 ]

年代:1992
 
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1. Taguchi's Parameter Design: A Panel Discussion
  Technometrics,   Volume  34,   Issue  2,   1992,   Page  127-161

VijayanN. Nair,   Bovas Abraham,   Jock MacKay,   George Box,   RaghuN. Kacker,   ThomasJ. Lorenzen,   JamesM. Lucas,   RaymondH. Myers,   G.Geoffrey Vining,   JohnA. Nelder,   MadhavS. Phadke,   Jerome Sacks,   WilliamJ. Welch,   AnneC. Shoemaker,   KwokL. Tsui,   Shin Taguchi,   C.F. Jeff Wu,  

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2. A Graph-Aided Method for Planning Two-Level Experiments When Certain interactions Are Important
  Technometrics,   Volume  34,   Issue  2,   1992,   Page  162-175

C.F. J. Wu,   Youyi Chen,  

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3. New Methods for One-Sided Tolerance Limits for a One-Way Balanced Random-Effects ANOVA Model
  Technometrics,   Volume  34,   Issue  2,   1992,   Page  176-185

MarkG. Vangel,  

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4. Diagnostics for Nonlinearity and Heteroscedasticity in Errors-in-Variables Regression
  Technometrics,   Volume  34,   Issue  2,   1992,   Page  186-196

R.J. Carroll,   C.H. Spiegelman,  

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5. Transformation-Model Diagnostics
  Technometrics,   Volume  34,   Issue  2,   1992,   Page  197-202

Chih-Ling Tsai,   Xizhi Wu,  

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6. Estimating Nonconformance Rates After Zero-Defect Sampling With Rectification
  Technometrics,   Volume  34,   Issue  2,   1992,   Page  203-213

BetsyS. Greenberg,   S.Lynne Stokes,  

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7. Buehler Confidence Bounds for a Reliability-Maintainability Measure
  Technometrics,   Volume  34,   Issue  2,   1992,   Page  214-222

J.Marcus Jobe,   H.T. David,  

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8. Generalized Linear Models (2nd ed.)
  Technometrics,   Volume  34,   Issue  2,   1992,   Page  223-224

JohnH. Schuenemeyer,  

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9. An Introduction to Generalized Linear Models
  Technometrics,   Volume  34,   Issue  2,   1992,   Page  224-225

Michael Emptage,  

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10. Generalized Additive Models
  Technometrics,   Volume  34,   Issue  2,   1992,   Page  225-226

RichardD. De Veaux,  

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