Technometrics


ISSN: 0040-1706        年代:1980
当前卷期:Volume 22  issue 2     [ 查看所有卷期 ]

年代:1980
 
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1. Kinetic Modelling With Multiresponse Data
  Technometrics,   Volume  22,   Issue  2,   1980,   Page  139-151

EricR. Ziegel,   JohnW. Gorman,  

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2. Self-Tuning and Adaptive Controllers: An Application to Catalytic Reactor Control
  Technometrics,   Volume  22,   Issue  2,   1980,   Page  153-164

T.J. Harris,   J.F. MacGregor,   J.D. Wright,  

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3. Life-Test Sampling Plans for Two-Parameter Weibull Populations
  Technometrics,   Volume  22,   Issue  2,   1980,   Page  165-177

K.W. Fertig,   NancyR. Mann,  

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4. Properties of Composite Sampling Procedures
  Technometrics,   Volume  22,   Issue  2,   1980,   Page  179-186

RobertS. Elder,   WilliamO. Thompson,   RaymondH. Myers,  

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5. The Properties of Moment Estimators for the Weibull Distribution Based on the Sample Coeffkient of Variation
  Technometrics,   Volume  22,   Issue  2,   1980,   Page  187-194

M.J. Newby,  

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6. Testing Adequacy of the Weibull and Log Linear Rate Models for a Poisson Process
  Technometrics,   Volume  22,   Issue  2,   1980,   Page  195-199

Larry lee,  

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7. Bayesian Prediction for the Left Truncated Exponential Distribution
  Technometrics,   Volume  22,   Issue  2,   1980,   Page  201-204

I.G. Evans,   A.H. M. Nigm,  

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8. Finite Sample Properties of Ridge Estimators
  Technometrics,   Volume  22,   Issue  2,   1980,   Page  205-212

T.D. Dwivedi,   V.K. Srivastava,   R.L. Hall,  

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9. An Adaptive Multiple Regression Procedure Based on M-Estimators
  Technometrics,   Volume  22,   Issue  2,   1980,   Page  213-224

ThomasF. Moberg,   JohnS. Ramberg,   RonaldH. Randler,  

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10. Robust Estimation of Location Using Optimally Chosen Sample Quantiles
  Technometrics,   Volume  22,   Issue  2,   1980,   Page  225-237

LaiK. Chan,   LennartS. Rhodin,  

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