Technometrics


ISSN: 0040-1706        年代:1979
当前卷期:Volume 21  issue 2     [ 查看所有卷期 ]

年代:1979
 
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1. A Class of Multiple Run Sampling Plans
  Technometrics,   Volume  21,   Issue  2,   1979,   Page  141-146

LonnieC. Vance,   GaryC. McDonald,  

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2. Obtaining Constant Prediction Variance on Concentric Triangles for Ternary Mixture Systems
  Technometrics,   Volume  21,   Issue  2,   1979,   Page  147-157

JohnA. Cornell,   AndreI. Khuri,  

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3. Designs for Mixture Experiments Involving Process Variables
  Technometrics,   Volume  21,   Issue  2,   1979,   Page  159-173

LynneB. Hare,  

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4. A Nonparametric Procedure for Process Control Based on Within-Group Ranking
  Technometrics,   Volume  21,   Issue  2,   1979,   Page  175-183

SaadT. Bakir,   MarionR. Reynolds,  

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5. Statistics of Extremes: An Alternate Method with Application to Bridge Design Codes
  Technometrics,   Volume  21,   Issue  2,   1979,   Page  185-191

JamesV. Zidek,   FrancisP.D. Navin,   Richard Lockhart,  

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6. On the Use of AIC for the Detection of Outliers
  Technometrics,   Volume  21,   Issue  2,   1979,   Page  193-199

Genshiro Kitagawa,  

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7. A Probability Distribution and its Uses in Fitting Data
  Technometrics,   Volume  21,   Issue  2,   1979,   Page  201-214

JohnS. Ramberg,   EdwardJ. Dudewicz,   PanduR. Tadikamalla,   EdwardF. Mykytka,  

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8. Generalized Cross-Validation as a Method for Choosing a Good Ridge Parameter
  Technometrics,   Volume  21,   Issue  2,   1979,   Page  215-223

GeneH. Golub,   Michael Heath,   Grace Wahba,  

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9. Missing Points in 2nand 2n−kFactorial Designs
  Technometrics,   Volume  21,   Issue  2,   1979,   Page  225-228

PeterW.M. John,  

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10. A Simple Procedure for Computing Performance Characteristics of Truncated Sequential Tests with Exponential Lifetimes
  Technometrics,   Volume  21,   Issue  2,   1979,   Page  229-232

Peichuen Kao,   EdwardP.C. Kao,   JackM. Mogg,  

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