Technometrics


ISSN: 0040-1706        年代:1993
当前卷期:Volume 35  issue 1     [ 查看所有卷期 ]

年代:1993
 
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1. A Systematic Approach to Planning for a Designed Industrial Experiment
  Technometrics,   Volume  35,   Issue  1,   1993,   Page  1-12

DavidE. Coleman,   DouglasC. Montgomery,  

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2. Discussion
  Technometrics,   Volume  35,   Issue  1,   1993,   Page  13-14

BertonH. Gunter,  

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3. Discussion
  Technometrics,   Volume  35,   Issue  1,   1993,   Page  15-17

GeraldJ. Hahn,  

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4. Discussion
  Technometrics,   Volume  35,   Issue  1,   1993,   Page  17-20

PerryD. Haaland,   M.A. O'Connell,  

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5. Discussion
  Technometrics,   Volume  35,   Issue  1,   1993,   Page  21-24

RamonV. Leon,   AnneC. Shoemaker,   Kwok-Leung Tsui,  

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6. Response
  Technometrics,   Volume  35,   Issue  1,   1993,   Page  25-27

DavidE. Coleman,   DouglasC. Montgomery,  

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7. A New Class of Supersaturated Designs
  Technometrics,   Volume  35,   Issue  1,   1993,   Page  28-31

DennisK. J. Lin,  

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8. On the Construction of Minimal Partially Replicated Orthogonal Main-Effect Plans
  Technometrics,   Volume  35,   Issue  1,   1993,   Page  32-36

Mike Jacroux,  

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9. Performance of CUSUM Control Schemes for Serially Correlated Observations
  Technometrics,   Volume  35,   Issue  1,   1993,   Page  37-52

Emmanuel Yashchin,  

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10. An Analysis of Taguchi's On-Line Quality-Monitoring Procedures for Attributes
  Technometrics,   Volume  35,   Issue  1,   1993,   Page  53-60

MohamadR. Nayebpour,   WilliamH. Woodall,  

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