Technometrics


ISSN: 0040-1706        年代:1987
当前卷期:Volume 29  issue 1     [ 查看所有卷期 ]

年代:1987
 
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1. Robust Empirical Bayes Analyses of Event Rates
  Technometrics,   Volume  29,   Issue  1,   1987,   Page  1-15

DonaldP. Gaver,   I.G. O'Muircheartaigh,  

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2. Fitting the Student-tDistribution to Grouped Data, With Application to a Particle Scattering Experiment
  Technometrics,   Volume  29,   Issue  1,   1987,   Page  17-22

RichardJ. Beckman,   MarkE. Johnson,  

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3. An Application of Imputation to an Estimation Problem in Grouped Lifetime Analysis
  Technometrics,   Volume  29,   Issue  1,   1987,   Page  23-32

MartinA. Tanner,   WingHung Wong,  

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4. Approximate Inference for the Generalized Gamma Distribution
  Technometrics,   Volume  29,   Issue  1,   1987,   Page  33-40

T.J. DiCiccio,  

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5. Performance of Likelihood – Based Interval Estimates for Two – Parameter Exponential Samples Subject to Type I Censoring
  Technometrics,   Volume  29,   Issue  1,   1987,   Page  41-49

WalterW. Piegorsch,  

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6. Limited Failure Population Life Tests: Application to Integrated Circuit Reliability
  Technometrics,   Volume  29,   Issue  1,   1987,   Page  51-65

WilliamQ. Meeker,  

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7. Computational Experience With Confidence Regions and Confidence Intervals for Nonlinear Least Squares
  Technometrics,   Volume  29,   Issue  1,   1987,   Page  67-82

JanetR. Donaldson,   RobertB. Schnabel,  

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8. Detecting Skewed Errors From Regression Residuals
  Technometrics,   Volume  29,   Issue  1,   1987,   Page  83-90

DennisD. Boos,  

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9. A Comparison of Alternative Tests for Lack of Fit
  Technometrics,   Volume  29,   Issue  1,   1987,   Page  91-93

NormanR. Draper,   Irwin Guttman,  

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10. The Use of Marginal Likelihood for a Diagnostic Test for the Goodness of Fit of the Simple Linear Regression Model
  Technometrics,   Volume  29,   Issue  1,   1987,   Page  95-101

Takemi Yanagimoto,   Masakatsu Yanagimoto,  

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