Technometrics


ISSN: 0040-1706        年代:1973
当前卷期:Volume 15  issue 1     [ 查看所有卷期 ]

年代:1973
 
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1. Formulation of a Nonlinear Predictor
  Technometrics,   Volume  15,   Issue  1,   1973,   Page  1-12

JudithZeh Nelson,   JohnW. Van Ness,  

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2. Discussion No. 1
  Technometrics,   Volume  15,   Issue  1,   1973,   Page  13-17

WilliamH. Lawton,  

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3. Likelihood Ratio Test for DiscriminaGon Between Two Models with Unknown Location and Scale Parameters
  Technometrics,   Volume  15,   Issue  1,   1973,   Page  19-27

Robert Dumonceaux,   CharlesE. Antle,   Gerald Haas,  

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4. Discussion No. 2
  Technometrics,   Volume  15,   Issue  1,   1973,   Page  29-31

H.Leon Harter,  

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5. Some Problems Associated with the Analysis of Multiresponse Data
  Technometrics,   Volume  15,   Issue  1,   1973,   Page  33-51

G.E.P. Box,   W.G. Hunter,   J.F. Macgregor,   J. Erjavec,  

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6. Errors of Measurement, Precision, Accuracy and the Statistical Comparison of Measuring Instruments
  Technometrics,   Volume  15,   Issue  1,   1973,   Page  53-66

FrankE. Grubbs,  

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7. A Comparison Of Some Models in Visual Sacanning Experiments
  Technometrics,   Volume  15,   Issue  1,   1973,   Page  67-78

Lalitha Sanathanan,  

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8. A Truncated Sequential t-Test for General α and β
  Technometrics,   Volume  15,   Issue  1,   1973,   Page  79-86

Robert Alexander,   Ronald Suich,  

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9. Tables for Obtaining Weibull Confidence Bounds and Tolerance Bounds Based on Best Linear Invariant Estimates of Parameters of the Extreme-Value Distribution
  Technometrics,   Volume  15,   Issue  1,   1973,   Page  87-101

NancyR. Mann,   KennethW. Fertig,  

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10. Quality Control Methods for Multivariate Binomial and Poisson Distributions
  Technometrics,   Volume  15,   Issue  1,   1973,   Page  103-112

H.I. Patel,  

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