Technometrics


ISSN: 0040-1706        年代:1979
当前卷期:Volume 21  issue 1     [ 查看所有卷期 ]

年代:1979
 
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1. Sampling Interval and Feedback Control
  Technometrics,   Volume  21,   Issue  1,   1979,   Page  1-8

Bovas Abraham,   GeorgeE.P. Box,  

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2. Switching Characteristics under MIL-STD-105D
  Technometrics,   Volume  21,   Issue  1,   1979,   Page  9-19

Takeshi Koyama,  

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3. Wald-Wolfowitz Type Sampling Plans for Continuous Production
  Technometrics,   Volume  21,   Issue  1,   1979,   Page  21-31

A.K. Shahani,  

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4. Confidence Limits on MTBF for Sequential Test Plans of MIL-STD 781
  Technometrics,   Volume  21,   Issue  1,   1979,   Page  33-42

CliffordM. Bryant,   Josef Schmee,  

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5. Inference for (Log) Normal Life Distributions from Small Singly Censored Samples and BLUES
  Technometrics,   Volume  21,   Issue  1,   1979,   Page  43-54

Wayne Nelson,   Josef Schmee,  

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6. Some Considerations in the Evaluation of Alternate Prediction Equations
  Technometrics,   Volume  21,   Issue  1,   1979,   Page  55-63

RichardF. Gunst,   RobertL. Mason,  

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7. Testing for Two-Phase Regressions
  Technometrics,   Volume  21,   Issue  1,   1979,   Page  65-69

R.J. Beckman,   R.D. Cook,  

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8. Logistic Discrimination and Bias Correction in Maximum Likelihood Estimation
  Technometrics,   Volume  21,   Issue  1,   1979,   Page  71-78

J.A. Anderson,   S.C. Richardson,  

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9. Two-Sided Screening Procedures in the Bivariate Case
  Technometrics,   Volume  21,   Issue  1,   1979,   Page  79-85

Loretta Li,   DonaldB. Owen,  

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10. Tables of the Studentized Maximum Modulus Distribution and an Application to Multiple Comparisons Among Means
  Technometrics,   Volume  21,   Issue  1,   1979,   Page  87-93

MichaelR. Stoline,   HansK. Ury,  

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