摘要:

X-ray photoelectron spectroscopy was used to analyze a thin film of polystyrene. Spin casting from a 2% by weight solution of polystyrene in toluene was utilized. Film thickness was determined to be 60 nm by ellipsometry. The thin film was examined with a Hewlett Packard 5950A ESCA spectrometer.

ISSN:1055-5269    

DOI:10.1116/1.1247712

出版商:American Vacuum Society    

年代:1993

数据来源: AIP

摘要:

X-ray photoelectron spectroscopy was used to analyze a thin film of polymethylmethacrylate (PMMA) which was spin cast from a 2% weight solution of PMMA in toluene onto a gold substrate. A Hewlett Packard 5950A ESCA spectrometer was used for this investigation.

ISSN:1055-5269    

DOI:10.1116/1.1247740

出版商:American Vacuum Society    

年代:1993

数据来源: AIP

摘要:

X-ray photoemission spectra of the core and valence levels for crystalline W–Ni–Fe superalloy are presented. Tungsten alloys are referred to as “superalloys” because of their high density and strength and are important engineering materials for numerous military and industrial applications [see D. J. Jones and P. Munnery, Powder Metall.10, 156 (1967)]. These alloys are prepared by liquid phase sintering [see P. N. Jones, Proceedings of the Second International Tungsten Symposium, San Francisco, CA, 1982 (unpublished), pp. 81–90]resulting in tungsten particles being cemented together by a solid solution of W–Ni–Fe with W being present in small quantities in the solid solution. The bulk composition of 84.9 W, 9.5 Ni, and 5.6 Fe at. % or 98.4 W, 3.4 Ni, and 1.9 Fe wt % [see K. L. Vasanth and C. M. Dacres, Proceedings of the 1987 Tri-Service Conference on Corrosion, WP AFB, OH, 1987 (unpublished), AFWAL-TR-87-4139, Vol. II, p. 165] was determined by EDAX analysis in a scanning electron microscope. XPS low resolution survey scan and higher resolution scans of the C 1s, O 1s, Si 2p, Fe 2p, Ni 2p, NiL3VV, W 4f, and valence band region were collected on a Perkin Elmer/Physical Electronics model # 5400 spectrometer using nonmonochromated Mg x rays. Analysis of XPS data reveals the following chemistries in the near surface region: (i) Fe is present in the form of Fe3O4, a highly oxygen deficient form of Fe2O3, and/or Fe2O3, (ii) Ni is mainly present as in Ni(OH)2, and (iii) the W metallic particles are covered with thin native oxide films of both WO2and WO3. The excellent corrosion resistance of both nickel and tungsten metals is due, respectively, to the presence of Ni(OH)2and WO2and WO3coatings on their surfaces.

ISSN:1055-5269    

DOI:10.1116/1.1247713

出版商:American Vacuum Society    

年代:1993

数据来源: AIP

摘要:

Polytetrafluorethylene (PTFE) is a technologically important material employed for broad applications due to its exceptional properties for lubrication, insulation, and chemical inertness. With regard to surface analysis, PTFE has been found to provide a ready standard source for the x-ray photoelectron F 1sline in a polymeric matrix. A previous submission [M. Ackeret, Surf. Sci. Spectra1, 100 (1992)] examined the uniformity of the atomic composition over the surface layers by angle dependent XPS analysis of the C 1sand F 1slines. In this submission we wish to present the photoelectron transitions by MgKαradiation.

ISSN:1055-5269    

DOI:10.1116/1.1247714

出版商:American Vacuum Society    

年代:1993

数据来源: AIP