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| 11. |
Argon Implanted into Graphite, by XPS |
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Surface Science Spectra,
Volume 1,
Issue 4,
1992,
Page 376-380
B. Vincent Crist,
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PDF (267KB)
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摘要:
Argon ions (Ar+) were implanted into a substrate of natural graphite (crystal) by 4 kV acceleration for a period of 5 min using a VG EX05 ion gun. (The surface plane of the substrate was perpendicular to the flight path of the argon ions.) No attempt was made to maximize the argon concentration within the graphite. The resulting concentration of argon within the graphite surface was approximately 4.0 at. %. The BE for Ar 2p3is 241.7 eV which is similar to the 241.9 eV obtained by Perkin Elmer [see J. F. Moulder, W. F. Stickle, P. E. Sobol, and K. O. Bomben,HandbookofX-rayPhotoelectronSpectroscopy, 2nd ed. (Perkin-Elmer Corporation, Eden Prairie, MN, 1992), p. 65].
ISSN:1055-5269
DOI:10.1116/1.1247636
出版商:American Vacuum Society
年代:1992
数据来源: AIP
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| 12. |
Orthorhombic YBa2Cu3O7Cleaved Single Crystal by XPS |
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Surface Science Spectra,
Volume 1,
Issue 4,
1992,
Page 381-392
D. E. Fowler,
D. C. Miller,
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PDF (445KB)
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摘要:
X-ray photoemission spectra from the cleaved surface of a single crystal of the high temperature superconductor, YBa2Cu3O7, are presented. All spectra were taken with the sample at room temperature. The spectra of this material are dependent on which cleavage planes are exposed following crystal fracture. Extremes in the spectra are given from the continuum of observed surfaces. These extremes are obtained from cleaves leaving large macroscopic terrace planes (larger than probe size), and from cleaves leaving highly stepped surfaces with microscopic terraces (smaller than the probe size). A distinct Fermi edge is observed in the valence band. The freshly cleaved surface is free from contamination, but the spectral line shape of O 1schanges with time. This may be related to the formation of contamination compounds and/or a chemical bonding instability at the cleaved surface of the superconductor.
ISSN:1055-5269
DOI:10.1116/1.1247637
出版商:American Vacuum Society
年代:1992
数据来源: AIP
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| 13. |
Single Crystal CuInSe2Analysis by High Resolution XPS |
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Surface Science Spectra,
Volume 1,
Issue 4,
1992,
Page 393-397
P. E. Sobol,
A. J. Nelson,
C. R. Schwerdtfeger,
W. F. Stickle,
J. F. Moulder,
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PDF (240KB)
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摘要:
Copper indium selenide (CIS) is a material commonly used in photovoltaic devices. High resolution XPS spectra are obtained from a freshly fractured single crystal CIS sample. Spectra include Cu 2p, In 3d and Se 3d core lines along with valence band and survey spectra.
ISSN:1055-5269
DOI:10.1116/1.1247638
出版商:American Vacuum Society
年代:1992
数据来源: AIP
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