摘要:

High quality single crystal ZnGeP2has been analyzed by x-ray photoelectron spectroscopy. This material is one of a group of pseudo-III–V compounds that crystallize in a tetragonal chalcopyrite structure and have been shown to have very promising nonlinear optical properties. The spectra presented here include survey and high resolution scans of the photoemission peaks, the Zn and Ge Auger transitions, and the valence band of the compound.

ISSN:1055-5269    

DOI:10.1116/1.1247781

出版商:American Vacuum Society    

年代:1994

数据来源: AIP

摘要:

High quality single crystal AgGaS2has been analyzed by x-ray photoelectron spectroscopy. This material is one of a group of I–III–VI2compounds that crystallize in a tetragonal chalcopyrite structure and have been shown to have very promising nonlinear optical properties. The spectra presented here include survey and high resolution scans of the photoemission peaks and valence band spectra.

ISSN:1055-5269    

DOI:10.1116/1.1247769

出版商:American Vacuum Society    

年代:1994

数据来源: AIP

摘要:

X-ray photoelectron spectroscopy (XPS) was used to characterize thin film of Cr–Si–O cermet, rf sputter-deposited onto a thermally oxidized Si wafer. Angle dependent spectra (θ=0° and 60°) were acquired on both the as received and the Ar+ion sputtered states. In the as received state the topmost layer is enriched in Si and O; Si and Cr are present in both oxidized and reduced forms. After sputtering by Ar+(2.5 keV, 6 × 1016ions/cm2), Cr becomes reduced to Cr0, and the relative amount of Si0increases substantially (i.e., up to about 40% of total Si). These reduced states are found to recombine to CrxSi-type silicides. The Cr–Si–O layers are applied as precision thin film resistors of good long-range stability with low temperature coefficient of resistivity. Heat treatment—leading to crystalline silicide phase—is used to consolidate the properties of these layers for device applications. We have shown (apparently for the first time), however, that room temperature ion impact can also create highly dispersed—nondetectable by XRD—silicide clusters, the formation of which has been deduced from the Si Auger parameter, being significantly higher for the silicide (aSi=1716.2–1716.5 eV) than for elemental Si (aSi=1716.0 eV).

ISSN:1055-5269    

DOI:10.1116/1.1247770

出版商:American Vacuum Society    

年代:1994

数据来源: AIP

摘要:

X-ray photoelectron spectroscopy was used for characterizing pumice: it is a natural aluminosilicate with a high percentage of silica (~70%), a low surface area (~5 m2g−1as determined by the BET method) and a density of 2.3 g cm−3. It has a fine, porous physical structure which makes the material easy to machine and also determines its abrasive property. In contrast to the zeolites, pumice has an amorphous structure. Apart from its main use in the construction industry, pumice has begun to be of scientific interest when used as a support for metallic catalysts. Core and valence spectra were compared with standard Al2O3and SiO2. The aim of this study is to examine the surface of this material.

ISSN:1055-5269    

DOI:10.1116/1.1247771

出版商:American Vacuum Society    

年代:1994

数据来源: AIP

摘要:

The XPS spectra of materials containing both magnesium and aluminum can exhibit a number of spectral artifacts when using a MgKαx-ray source. These artifacts are easily observed in XPS spectra of magnesium aluminate (MgAl2O4, also known as magnesium aluminum oxide), which are presented in this article. For example, the Al 2p peak is overlapped by the MgKαx-ray satellites from the Mg 2speak, and the MgKαx-ray induced MgKLLAuger peak. In addition, the Mg 2ppeak can be overlapped by a C 1sx-ray ghost line caused by stray AlKαx-ray radiation when using a dual Mg/Al x-ray source. Because of these artifacts, the amounts of Mg and Al in such samples should be quantified (when using a MgKαx-ray source) using the Mg 2sand Al 2speaks, respectively, which are free of these artifacts.

ISSN:1055-5269    

DOI:10.1116/1.1247772

出版商:American Vacuum Society    

年代:1994

数据来源: AIP

摘要:

Zinc aluminate (ZnAl4O4, also known as zinc aluminum oxide) is a material that has applications as a catalyst and catalyst support. This paper presents the XPS spectra of the major Zn, Al, and O photoelectron lines, and the major x-ray induced ZnLMMAuger lines for ZnAl2O4.

ISSN:1055-5269    

DOI:10.1116/1.1247773

出版商:American Vacuum Society    

年代:1994

数据来源: AIP

摘要:

This article presents the main core lines and the valence band x-ray photoelectron (XPS) spectra obtained for a commercial gamma-alumina (γ-Al2O3) powder. The electronic record includes the Al 2p, Al 2s, O 1s, O 2s, C 1s, and valence band spectra. Although it is usually difficult to distinguish among the various forms of aluminum oxide [Al2O3], oxyhydroxide [AlO(OH)]and hydroxide [Al(OH)3] based on the core XPS binding energies, the valence band spectra for many of these materials are unique. The valence band spectrum for γ-Al2O3shows two broad distinct peaks that are separated by about 3.3 eV.

ISSN:1055-5269    

DOI:10.1116/1.1247774

出版商:American Vacuum Society    

年代:1994

数据来源: AIP

摘要:

In this study, the surface composition of a fresh, commercial, alumina Claus catalyst (Alcoa S-100) was examined by x-ray photoelectron spectroscopy (XPS). This article presents the main XPS core lines and the valence band spectra obtained for the Claus catalyst. The electronic record includes the Al 2p, Al 2s, O 1s, O 2p, C 1s, and valence band spectra.

ISSN:1055-5269    

DOI:10.1116/1.1247775

出版商:American Vacuum Society    

年代:1994

数据来源: AIP

摘要:

The XPS spectrum of the boron suboxide, B6O, is reported. The spectra were obtained on a powder sample that was prepared and characterized at the Diamond Technology Center, Norton Company. It was characterized with x-ray diffraction and was prepared by established methods. The B 1speak is split into two components of approximately equal area corresponding to the equal numbers of boron atoms at the two inequivalent sites of the B6O structure. The two B 1scomponents have binding energies of 187.4 and 189.2 eV.

ISSN:1055-5269    

DOI:10.1116/1.1247776

出版商:American Vacuum Society    

年代:1994

数据来源: AIP

摘要:

XPS data have been obtained from a polycrystalline Ag foil supplied by AESAR. Initial data indicates a highly contaminated surface region. The foil was heated to 250° C and then sputtered with a 2 keV beam of Ar+for 35 min. Ion scattering spectroscopy, angle-resolved Auger electron spectroscopy, and x-ray photoelectron spectroscopy data indicate the presence of a small amount of subsurface oxygen which could not be removed by the cleaning procedure used. These spectra will be useful in XPS studies of Ag systems such as alumina-supported silver epoxidation catalysts.

ISSN:1055-5269    

DOI:10.1116/1.1247777

出版商:American Vacuum Society    

年代:1994

数据来源: AIP