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1. |
Cu2O by XPS |
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Surface Science Spectra,
Volume 5,
Issue 4,
1998,
Page 257-261
R. P. Vasquez,
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PDF (80KB)
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摘要:
X-ray photoemission measurements of Cu2O are presented.
ISSN:1055-5269
DOI:10.1116/1.1247881
出版商:American Vacuum Society
年代:1998
数据来源: AIP
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2. |
CuO by XPS |
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Surface Science Spectra,
Volume 5,
Issue 4,
1998,
Page 262-266
R. P. Vasquez,
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PDF (69KB)
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摘要:
X-ray photoemission measurements of CuO are presented.
ISSN:1055-5269
DOI:10.1116/1.1247882
出版商:American Vacuum Society
年代:1998
数据来源: AIP
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3. |
Cu(OH)2by XPS |
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Surface Science Spectra,
Volume 5,
Issue 4,
1998,
Page 267-272
R. P. Vasquez,
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PDF (76KB)
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摘要:
X-ray photoemission measurements of Cu(OH)2are presented.
ISSN:1055-5269
DOI:10.1116/1.1247883
出版商:American Vacuum Society
年代:1998
数据来源: AIP
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4. |
CuCO3by XPS |
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Surface Science Spectra,
Volume 5,
Issue 4,
1998,
Page 273-278
R. P. Vasquez,
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PDF (76KB)
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摘要:
X-ray photoemission measurements of CuCO3are presented.
ISSN:1055-5269
DOI:10.1116/1.1247884
出版商:American Vacuum Society
年代:1998
数据来源: AIP
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5. |
CuSO4by XPS |
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Surface Science Spectra,
Volume 5,
Issue 4,
1998,
Page 279-284
R. P. Vasquez,
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PDF (76KB)
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摘要:
X-ray photoemission measurements of CuSO4are presented.
ISSN:1055-5269
DOI:10.1116/1.1247885
出版商:American Vacuum Society
年代:1998
数据来源: AIP
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6. |
HgBa2CaCu2O6+δby XPS |
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Surface Science Spectra,
Volume 5,
Issue 4,
1998,
Page 285-292
R. P. Vasquez,
M. Rupp,
A. Gupta,
C. C. Tsuei,
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PDF (97KB)
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摘要:
XPS core level and valence band spectra are presented for a chemically etched epitaxial thin film of superconducting HgBa2CaCu2O6+δ(Tc= 123 K) on a SrTiO3(100) substrate. These data exhibit lower levels of high binding energy contaminant signals in the O 1sand alkaline earth core level regions compared to studies in the literature, and a clear Fermi edge in the valence band region, evidence of a high quality surface.
ISSN:1055-5269
DOI:10.1116/1.1247886
出版商:American Vacuum Society
年代:1998
数据来源: AIP
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7. |
TlBa2CaCu2O7−δby XPS |
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Surface Science Spectra,
Volume 5,
Issue 4,
1998,
Page 293-303
R. P. Vasquez,
M. P. Siegal,
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PDF (125KB)
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摘要:
XPS core level and valence band spectra are presented for chemically etched epitaxial thin films of superconducting TlBa2CaCu2O7−δ, one of which is as-grown overdoped (superconducting transition temperature [Tc] = 74.5 K) and two which are annealed (Tc= 86.5 K and 87.5 K). The core levels measured from the annealed films are shifted to higher binding energies relative to those from the as-grown overdoped film, consistent with a doping-induced change in the chemical potential.
ISSN:1055-5269
DOI:10.1116/1.1247887
出版商:American Vacuum Society
年代:1998
数据来源: AIP
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8. |
Tl2Ba2CuO6+δby XPS |
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Surface Science Spectra,
Volume 5,
Issue 4,
1998,
Page 304-312
R. P. Vasquez,
Z. F. Ren,
J. H. Wang,
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PDF (114KB)
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摘要:
XPS core level and valence band spectra are presented for chemically etched epitaxial thin films of superconducting Tl2Ba2CuO6+δon SrTiO3(100) substrates which are as-grown overdoped (superconducting transition temperature [Tc]=11 K) and annealed (Tc=63 K). The core levels measured from the annealed film are shifted to higher binding energies relative to those from the as-grown overdoped film, consistent with a doping-induced change in the chemical potential.
ISSN:1055-5269
DOI:10.1116/1.1247875
出版商:American Vacuum Society
年代:1998
数据来源: AIP
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9. |
Photopolymerized C60Film by XPS |
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Surface Science Spectra,
Volume 5,
Issue 4,
1998,
Page 313-317
Aiko Nakao,
Jun Onoe,
Kazuo Takeuchi,
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PDF (77KB)
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摘要:
We present here the changes in the valence band and the C 1score peak and its shake-up satellite of a C60film upon photopolymerization using x-ray photoelectron spectroscopy. It was found that the intensity of the C 1sshake-up satellite of the phototransformed C60film decreased with increasing irradiation time of 500 W mercury lamp (0 to 200 h). On the other hand, the valence band spectra of the C60film was almost unchanged even after 200 h of irradiation, compared with that of pristine C60film.
ISSN:1055-5269
DOI:10.1116/1.1247876
出版商:American Vacuum Society
年代:1998
数据来源: AIP
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10. |
High Resolution Spectra of Poly(cis-isoprene) |
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Surface Science Spectra,
Volume 5,
Issue 4,
1998,
Page 318-323
Sven Mähl,
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PDF (183KB)
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摘要:
X-ray photoelectron spectroscopy was used to analyze poly(cis-isoprene). The polymer was centrifugally spin cast on a silicon wafer. We find that thecisspectrum can be described by five Voigt profiles. The parameters of the lines with standard deviations are found by least-square fitting.
ISSN:1055-5269
DOI:10.1116/1.1247877
出版商:American Vacuum Society
年代:1998
数据来源: AIP
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