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1. |
Characterization of Perfluorinated Polyether (PFPE) Disk Drive Lubricants |
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Surface Science Spectra,
Volume 4,
Issue 4,
1996,
Page 297-311
B. H. Augustine,
C. E. Bryson,
L. A. Vasilyev,
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摘要:
We report the XPS characterization of perfluorinated polyether (PFPE) samples used as lubricants for magnetic disk drive heads. Survey and high resolution C, O, and F spectra were obtained for eight different polyether formulations using a monochromaticAlKαsource. Sample charging was evident in the samples, and was minimized throughout by the use of thin films of the samples and data collection under a metallic screen.
ISSN:1055-5269
DOI:10.1116/1.1247833
出版商:American Vacuum Society
年代:1996
数据来源: AIP
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2. |
Poly(bisphenol A carbonate) During XPS Measurements |
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Surface Science Spectra,
Volume 4,
Issue 4,
1996,
Page 312-315
Ch. Girardeaux,
J.-J. Pireaux,
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摘要:
We present XPS measurements of poly(bisphenol A carbonate) [C16O3H14]n(Polysciences Europe GmbH). This polymer is a constituent of polymer blends (PC + PMMA) studied for their superficial composition versus blend composition.
ISSN:1055-5269
DOI:10.1116/1.1247830
出版商:American Vacuum Society
年代:1996
数据来源: AIP
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3. |
Study of the First Row Transition Metals by X-ray Photoelectron Spectroscopy |
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Surface Science Spectra,
Volume 4,
Issue 4,
1996,
Page 316-344
Catherine S. Lawson,
Brian J. Tielsch,
Julia E. Fulghum,
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摘要:
XPS spectra have been obtained from six metals in the first row of transition elements using a Kratos AXIS HS x-ray photoelectron spectrometer. The six metals analyzed include Cu, Ni, Zn, V, Ge, and Fe. Each sample was Ar+ion etched before XPS analysis to remove the majority of C and O contamination. The spectra include standard survey scans and high-resolution scans of the photoelectron peaks, as well as x-ray induced Auger peaks. Each spectrum was collected using a monochromatic AlKαx-ray source operated at 300 W (20 mA, 15 kV). Survey scans were collected using an 80 eV pass energy, while high resolution scans were recorded using a 20 eV pass energy unless indicated otherwise.
ISSN:1055-5269
DOI:10.1116/1.1247829
出版商:American Vacuum Society
年代:1996
数据来源: AIP
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4. |
Characterization of the Surface of FeO Powder by XPS |
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Surface Science Spectra,
Volume 4,
Issue 4,
1996,
Page 345-350
A. N. Mansour,
Robert A. Brizzolara,
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PDF (124KB)
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摘要:
We report x-ray photoemission spectra of the surface of iron oxide (FeO) particles. The research grade high purity FeO sample was commercially obtained from Alfa/AESAR. The XPS spectra were measured with the Physical Electroncs Model 5400 x-ray photoelectron spectrometer using unmonochromatized MgKαx-rays at two pass energy settings corresponding to analyzer resolutions of 1.34 and 0.54 eV. We present the survey spectrum (binding energy range of 0–1100 eV) measured at an analyzer energy resolution of 1.34 eV. Multiplexes of the C 1s, O 1sand 2s, and Fe 2pand 3pphotoemission lines, valence band region as well as the FeLVVAuger line were measured at an analyzer energy resolution of 0.54 eV. The XPS data indicate that the surface of FeO powdered material consists mainly of Fe2O3with small quantities of FeOOH, oxidized carbon, and hydrocarbon as contaminants.
ISSN:1055-5269
DOI:10.1116/1.1247831
出版商:American Vacuum Society
年代:1996
数据来源: AIP
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5. |
Characterization of the Surface ofγ-Fe2O3Powder by XPS |
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Surface Science Spectra,
Volume 4,
Issue 4,
1996,
Page 351-356
A. N. Mansour,
Robert A. Brizzolara,
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PDF (128KB)
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摘要:
We report x-ray photoemission spectra of the surface of iron (III) oxide (γ-Fe2O3) particles. The research grade high purity (99.0%) (γ-Fe2O3) sample was commercially obtained from Alfa/AESAR. The XPS spectra were measured with the Physical Electroncs Model 5400 x-ray photoelectron spectrometer using unmonochromatized MgKαx-rays at two pass energy settings corresponding to analyzer resolutions of 1.34 and 0.54 eV. We present the survey spectrum (binding energy range of 0–1100 eV) measured at an analyzer energy resolution of 1.34 eV. Multiplexes of the C 1s, O 1sand 2s, and Fe 2pand 3pphotoemission lines, valence band region as well as the FeLVVAuger line were measured at an analyzer energy resolution of 0.54 eV. The XPS data indicate that the surface of (γ-Fe2O3) powdered material consists mainly of its bulk chemistry with small quantities of FeOOH, oxidized carbon, and hydrocarbon as contaminants.
ISSN:1055-5269
DOI:10.1116/1.1247832
出版商:American Vacuum Society
年代:1996
数据来源: AIP
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6. |
Characterization of the Surface ofα-FeOOH Powder by XPS |
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Surface Science Spectra,
Volume 4,
Issue 4,
1996,
Page 357-362
A. N. Mansour,
Robert A. Brizzolara,
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PDF (143KB)
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摘要:
We report x-ray photoemission spectra of the surface of iron (III) oxyhydroxide (α-FeOOH) particles. Research grade purity (99.0%)α-FeOOH sample was commercially obtained from Alfa/AESAR. The XPS spectra were measured with the Physical Electronics Model 5400 X-ray Photoelectron Spectrometer using unmonochromated MgKαx-rays at two pass energy settings corresponding to analyzer energy resolutions of 1.34 and 0.54 eV. We present the survey spectrum (binding energy range of 0–1100 eV) measured at an analyzer energy resolution of 1.34 eV. Multiplexes of the C 1s, O 1sand 2s, Fe 2pand 3pphotoemission lines, valence band region as well as the FeL3VVAuger line were measured at an analyzer energy resolution of 0.54 eV. The XPS spectra indicate that the surface ofα-FeOOH powdered material consists mainly of its bulk chemistry with small quantities of oxidized carbon and hydrocarbon as contaminants.
ISSN:1055-5269
DOI:10.1116/1.1247825
出版商:American Vacuum Society
年代:1996
数据来源: AIP
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7. |
Characterization of Polystyrene (1 kDa) with a Perfluorinated Endgroup by TOF-SIMS: Effects of Sample Preparation |
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Surface Science Spectra,
Volume 4,
Issue 4,
1996,
Page 363-369
A. M. Belu,
M. O. Hunt,
R. W. Linton,
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摘要:
TOF-SIMS measurements of a thick film 1 kDa polystyrene functionalized with a perfluoroalkyl endgroup are presented. Characteristic fragment signals in the low mass range are observed. The thick film of 1 kDa functionalized polystyrene is also analyzed with an overlayer of silver. This modification in sample preparation allows intact oligomer signals to be generated from the surfaces of thick films (i.e., in bulk form) of low molecular weight polymers.
ISSN:1055-5269
DOI:10.1116/1.1247826
出版商:American Vacuum Society
年代:1996
数据来源: AIP
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8. |
Characterization of Polystyrenes (5 and 40 kDa) Functionalized with a Perfluorinated Endgroup by TOF-SIMS: Effects of Molecular Weight |
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Surface Science Spectra,
Volume 4,
Issue 4,
1996,
Page 370-380
A. M. Belu,
M. O. Hunt,
J. M. DeSimone,
R. W. Linton,
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摘要:
TOF-SIMS measurements of 5 and 40 kDa polystyrene functionalized with a perfluoroalkyl endgroup are presented. Fragment signals in the low mass range are observed for both 5 and 40 kDa samples, using monolayer sample preparation on a silver substrate. Additionally for the 5 kDa sample, intact oligomer signals in the high mass range and chain cleavage signals in the intermediate mass range are generated. The successful functionalization of the polystyrene with the perfluoroalkyl endgroup can be confirmed by the masses at which the intact oligomer signals arise.
ISSN:1055-5269
DOI:10.1116/1.1247828
出版商:American Vacuum Society
年代:1996
数据来源: AIP
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9. |
Characterization of Polystyrene (1 kDa) Functionalized with a Dimethyl- phenylsilane Endgroup by TOF-SIMS: Effect of Post-Ionization Using a Nonresonant Multiphoton Technique |
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Surface Science Spectra,
Volume 4,
Issue 4,
1996,
Page 381-386
A. M. Belu,
M. O. Hunt,
J. M. DeSimone,
R. W. Linton,
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PDF (135KB)
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摘要:
TOF-SIMS measurements of 1 kDa polystyrene functionalized with a dimethylphenylsilane endgroup are presented and compared with measurements made by multiphoton ionization sputtered neutral mass spectrometry (MPI-SNMS). Silver cationized intact oligomer signals are obtained by TOF-SIMS and non-silver cationized intact oligomer signals are generated with MPI-SNMS. TheMnvalues from both methods are in good agreement.
ISSN:1055-5269
DOI:10.1116/1.1247827
出版商:American Vacuum Society
年代:1996
数据来源: AIP
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