摘要:

Filament-assisted chemical vapor deposition (CVD) diamond film growth on Si(100) was studied using x-ray photoelectron spectroscopy (XPS) in a system that couples a growth chamber to an ultrahigh vacuum analytical chamber. Diamond nucleates and grows on a SiC layer formed on the Si(100) substrate [D. N. Belton and S. J. Schmieg, Appl. Phys. Lett.54, 416 (1989)]. After about 17 h growth XPS showed no Si signal from the substrate, no detectable contaminants, and only carbon present in survey scans. Electron energy loss spectroscopy (EELS) spectra obtained by x-ray excitation of the C 1slevel can be used as a fingerprint for distinguishing diamond from graphite or carbides [D. N. Belton and S. J. Schmieg, J. Vac. Sci. Technol. A8, 2353 (1990)]. The identification of a continuous diamond film was confirmed with Raman spectroscopy and scanning electron microscopy (SEM).

ISSN:1055-5269    

DOI:10.1116/1.1247661

出版商:American Vacuum Society    

年代:1992

数据来源: AIP

摘要:

X-ray photoelectron spectroscopy (XPS) was used to characterize a highly oriented pyrolytic graphite (HOPG) sample. The HOPG was cleaved using scotch tape prior to introduction into an ultrahigh vacuum analytical chamber. No further cleaning was used as no elements other than carbon were detected in XPS survey scans. Electron energy loss spectroscopy (EELS) spectra obtained by x-ray excitation of the C 1slevel can be used as a fingerprint for distinguishing graphite from diamond or carbides [see D. N. Belton and S. J. Schiemg, J. Vac. Technol. A8, 2353 (1990)].

ISSN:1055-5269    

DOI:10.1116/1.1247662

出版商:American Vacuum Society    

年代:1992

数据来源: AIP

摘要:

X-ray photoelectron spectroscopy (XPS) and low energy electron diffraction (LEED) were used to characterize a clean and highly-oriented Ni(100) single crystal. The Ni(100) crystal was cleaned and ordered with a combination of Ar-ion bombardment and annealing. There were no contaminants observed in XPS. The XPS binding energies were referenced to the Fermi edge of the clean nickel crystal.

ISSN:1055-5269    

DOI:10.1116/1.1247663

出版商:American Vacuum Society    

年代:1992

数据来源: AIP

摘要:

XPS measurements are presented for poly (methyl methacrylate). The data include the valence band region and the principal core levels.

ISSN:1055-5269    

DOI:10.1116/1.1247664

出版商:American Vacuum Society    

年代:1992

数据来源: AIP

摘要:

XPS measurements for poly (ethyl methacrylate). The data include the valence band region and the principal core levels.

ISSN:1055-5269    

DOI:10.1116/1.1247665

出版商:American Vacuum Society    

年代:1992

数据来源: AIP

摘要:

XPS measurements are presented for high purity poly (n-butyl methacrylate). The data include the valence band region and the principal core levels.

ISSN:1055-5269    

DOI:10.1116/1.1247666

出版商:American Vacuum Society    

年代:1992

数据来源: AIP

摘要:

XPS measurements are presented for high purity poly (iso-butyl methacrylate). The data include the valence band region and the principal core levels.

ISSN:1055-5269    

DOI:10.1116/1.1247632

出版商:American Vacuum Society    

年代:1992

数据来源: AIP

摘要:

XPS core level and valence band measurements are presented for a twinned LaAlO3(100) crystal.

ISSN:1055-5269    

DOI:10.1116/1.1247633

出版商:American Vacuum Society    

年代:1992

数据来源: AIP

摘要:

Both core level and valence band XPS spectra were obtained from an ultrahigh purity (UHP) graphite electrode surface. This UHP graphite had a very low oxygen content and an extremely low nitrogen content on its surface. It had a very graphitic structure in both the surface and the bulk as evidenced by XPS and XRD studies. [See Y. Xie and P. M. A. Sherwood, Appl. Spectrosc.43, 1153 (1989); Chem. Mater.1, 427 (1989);2, 293 (1990); Appl. Spectrosc.44, 797 (1990); Chem. Mater.3, 164 (1991); Appl. Spectrosc.44, 1621 (1990);45, 1158 (1991); Y. Xie, T. Wang, O. Franklin, and P. M. A. Sherwood,ibid.46, 645 (1992).] Our previously reported work [Y. Xie and P. M. A. Sherwood, Chem. Mater.1, 427 (1989);2, 293 (1990); Appl. Spectrosc.44, 797 (1990); Chem. Mater.3, 164 (1991); Appl. Spectrosc.44, 1621 (1990);45, 1158 (1991); Y. Xie, T. Wang, O. Franklin, and P. M. A. Sherwood,46, 645 (1992)] showed that XPS valence band spectra were more sensitive to the surface chemical environment than core level spectra, and could be well interpreted by X–αcalculations with model compounds. In this work, the valence band spectrum shows that there were two different types of oxygen species on the UHP graphite surface. In separate data records published in Surface Science Spectra, however [see Y. Xie, T. Wang, M. A. Rooke, and P. M. A. Sherwood, Surf. Sci. Spectra2, 192 (1992)], the valence band spectra showed that only one of the two different oxygen species could be seen on the highly oriented pyrolytic graphite (HOPG) surface, and the other of the two different oxygen species could be seen on the Du Pont E-120 high modulus pitch-based carbon fiber surface. No nitrogen was detected on either the HOPG or the E-120 carbon fiber surface.

ISSN:1055-5269    

DOI:10.1116/1.1247634

出版商:American Vacuum Society    

年代:1992

数据来源: AIP

摘要:

Specimens were prepared by growing a 1μm thickn-type (4 × 1017/ cm3Si) GaAs buffer layer on GaAs(001) in a Varian Gen-II MBE chamber, followed by As capping with As4for transfer through the air. After entry into the preparation chamber associated with the XPS system, the As cap was desorbed by annealing for 5 min at 450°C in ultrahigh vacuum. The resulting surfaces were As terminated and free of contaminants, as judged by XPS, and exhibited a clear, sharpc(2 × 8)/(2 × 4) LEED pattern.

ISSN:1055-5269    

DOI:10.1116/1.1247635

出版商:American Vacuum Society    

年代:1992

数据来源: AIP