31. |
Radiation enhanced P-diffusion in germanium |
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Radiation Effects,
Volume 49,
Issue 1-3,
1980,
Page 165-167
V.F. Stas,
L.S. Smirnov,
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ISSN:0033-7579
DOI:10.1080/00337578008243087
出版商:Taylor & Francis Group
年代:1980
数据来源: Taylor
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32. |
Carrier removal by implanted IONS in GaAs |
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Radiation Effects,
Volume 49,
Issue 1-3,
1980,
Page 169-172
H.S. Gecim,
B.J. Sealy,
K.G. Stephens,
Y. Ono,
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PDF (266KB)
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ISSN:0033-7579
DOI:10.1080/00337578008243088
出版商:Taylor & Francis Group
年代:1980
数据来源: Taylor
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33. |
Lattice location of light implanted ions in Si and Ge after laser annealing |
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Radiation Effects,
Volume 49,
Issue 1-3,
1980,
Page 173-175
G. Battaglini,
G.Della Mea,
G. Foti,
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ISSN:0033-7579
DOI:10.1080/00337578008243089
出版商:Taylor & Francis Group
年代:1980
数据来源: Taylor
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34. |
Effect of the fermi level position in silicon on ion-induced displacement of impurities |
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Radiation Effects,
Volume 49,
Issue 1-3,
1980,
Page 177-182
L.W. Wiggers,
F.W. Saris,
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摘要:
With the channeling technique the lattice location of both As and B is studied in single As-or B-doped and in doubly As-and B-doped silicon single crystals. The influence of the position of the Fermi-level on the displacement of impurity atoms off substitutional lattice sites is investigated by changing the crystals fromn-top−type or vice versa by choosing implant conditions and annealing termperatures for the doubly doped crystals in an appropriate way. Big changes were found in displacement cross sections for As and B after conversion of the crystals fromn-top-type. The results can be explained by assuming that the interaction between primary defects and impurity atoms causing the displacement of the impurity atom is controlled by Coulomb attraction between charged point defects and the impurity atoms.
ISSN:0033-7579
DOI:10.1080/00337578008243090
出版商:Taylor & Francis Group
年代:1980
数据来源: Taylor
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35. |
Correlation between structural and electrical profiles in ion-implanted GaAs |
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Radiation Effects,
Volume 49,
Issue 1-3,
1980,
Page 183-186
D.K. Sadana,
G.R. Booker,
B.J. Sealy,
K.G. Stephens,
M.H. Badawi,
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ISSN:0033-7579
DOI:10.1080/00337578008243091
出版商:Taylor & Francis Group
年代:1980
数据来源: Taylor
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36. |
Laser annealing of radiation defects in low disordered layers |
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Radiation Effects,
Volume 49,
Issue 1-3,
1980,
Page 187-190
G.A. Kachurin,
E.V. Nidaev,
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摘要:
Carrier concentration and mobility dependences on the annealing temperature have been compared for the cases of thermal (10 min) and laser (8 ms) annealing of silicon, implanted with low doses of P+ions. It was found that the recovery of concentration and mobility depended on the heating time in different ways. The laser annealing requires higher temperatures for mobility recovery then the thermal treatment. The same temperature shift was observed for increase of carrier concentration but only after doses less than 3.1012m−2. When the doses exceeded 3.1012cm−2laser and thermal annealing resulted in equal electron concentrations providing the equality of heating temperatures. Annealing of disordered regions was accounted for the mobility recovery. The increase of electron concentration was explained as an instantaneous decay of defect-impurity complexes. To check the validity of the assumptions laser annealing of electron and light ions irradiated materials was investigated.
ISSN:0033-7579
DOI:10.1080/00337578008243092
出版商:Taylor & Francis Group
年代:1980
数据来源: Taylor
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37. |
Ion implantation in superconducting niobium and Nb3Sn thin films: Adjustment of josephson microbridges and squid |
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Radiation Effects,
Volume 49,
Issue 1-3,
1980,
Page 191-194
J.Y. Robic,
J. Piaguet,
D. Duret,
J.C. Veler,
J.L. Veran,
D. Zenatti,
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ISSN:0033-7579
DOI:10.1080/00337578008243093
出版商:Taylor & Francis Group
年代:1980
数据来源: Taylor
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