摘要:

Radiotracer techniques have been used to show that Zn diffusion into an originally uniformly Mn‐doped GaAs wafer produces marked changes in the Mn concentration profile, resulting in a large minimum behind and a small minimum ahead of the Zn diffusion front. A model which assumes that Mn is an amphoteric impurity in GaAs is proposed to explain these changes.

ISSN:0003-6951    

DOI:10.1063/1.1754709

出版商:AIP    

年代:1966

数据来源: AIP

摘要:

Deep penetration of donors has been observed as a result of 20‐kV Sb ion implantations into ⟨110⟩‐ and ⟨111⟩‐oriented, high‐resistivity silicon. The density profiles were measured by a capacitance‐voltage method. The deep penetrating tail was found to be independent of such experimental parameters as temperature of implant (forT≥ 300°C), orientation, annealing, and surface condition; and to empirically follow aN∝ (x+B)2.2dependence over four orders of magnitude (B≈ 0.15 &mgr;). This component has not been observed previously in silicon and has a different dependence on implantation parameters and a different functional form than that observed in ion channeling.

ISSN:0003-6951    

DOI:10.1063/1.1754710

出版商:AIP    

年代:1966

数据来源: AIP

ISSN:0003-6951    

DOI:10.1063/1.1754711

出版商:AIP    

年代:1966

数据来源: AIP

摘要:

Avalanche radiation has been observed from the bulk of long, thin, forward‐biasedp+‐p‐n+silicon diodes with applied field strengths as low as 1000 V/cm. At higher fields, surface arc erosion streaks occurred and these followed crystallographic plane directions rather than the applied field orientation. Possible explanations are given for the several effects that contribute to the observed phenomena.

ISSN:0003-6951    

DOI:10.1063/1.1754712

出版商:AIP    

年代:1966

数据来源: AIP

ISSN:0003-6951    

DOI:10.1063/1.1754713

出版商:AIP    

年代:1966

数据来源: AIP

摘要:

From a careful evaluation of a very simple hologram, the photographically produced grating, we have been able to obtain quantitative data on image reconstruction efficiency as a function of processing procedures and illumination parameters such as orientation angle and wavelength. Experimental results are presented which show the dependence of efficiency on exposure, both before and after bleaching of the emulsion layer. In addition, the orientation sensitivity of thick‐emulsion holograms is studied, and it is shown that maximum diffracted power occurs when the Bragg reflection condition is satisfied.

ISSN:0003-6951    

DOI:10.1063/1.1754714

出版商:AIP    

年代:1966

数据来源: AIP

摘要:

The method of ``white‐light reflection holography'' first described by Stroke and Labeyrie (Physics Letters20, 368, March 1, 1966) and subsequently verified by a number of authors, has now been extended to the recording of volume holograms in 6–7‐&mgr;‐thick Kodak 649F emulsions on sheet film, with a quality in the reconstructed images comparing favorably with the images reconstructed from the 17‐&mgr;‐thick emulsions on glass plates used heretofore. The results presented have also permitted us to further verify a simple ``crystallographic'' theory of the method, first used by Stroke and Labeyrie (ibid.) and further described by G. W. Stroke in a subsequent paper.

ISSN:0003-6951    

DOI:10.1063/1.1754715

出版商:AIP    

年代:1966

数据来源: AIP

ISSN:0003-6951    

DOI:10.1063/1.1754716

出版商:AIP    

年代:1966

数据来源: AIP

ISSN:0003-6951    

DOI:10.1063/1.1754719

出版商:AIP    

年代:1966

数据来源: AIP