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| 11. |
USE OF A LASER DIFFRACTION PATTERN TO STUDY SURFACE SELF‐DIFFUSION OF METALS |
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Applied Physics Letters,
Volume 10,
Issue 9,
1967,
Page 258-260
H. P. Bonzel,
N. A. Gjostein,
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摘要:
A new method is described for continuously monitoring surface self‐diffusion in an ultrahigh vacuum environment by means of a laser diffraction pattern obtained from a sinusoidal surface profile. The method permits a continuous measurement of the surface self‐diffusion coefficient to be made while simultaneously observing the structure and cleanliness of a surface by low‐energy electron diffraction techniques.
ISSN:0003-6951
DOI:10.1063/1.1754937
出版商:AIP
年代:1967
数据来源: AIP
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| 12. |
Erratum: Measurement of Diffused Semiconductor Surface Concentrations by Infrared Plasma Reflection |
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Applied Physics Letters,
Volume 10,
Issue 9,
1967,
Page 260-260
E. E. Gardner,
W. Kappallo,
E. R. Gordon,
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PDF (62KB)
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ISSN:0003-6951
DOI:10.1063/1.1754938
出版商:AIP
年代:1967
数据来源: AIP
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