11. |
Ordering in semiconductor alloys |
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Applied Physics Letters,
Volume 56,
Issue 8,
1990,
Page 731-733
J. E. Bernard,
R. G. Dandrea,
L. G. Ferreira,
S. Froyen,
S.‐H. Wei,
A. Zunger,
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摘要:
A thermodynamic first‐principles theory of stability, including charge transfer, elastic forces, and atomic relaxations reveals the physical origins of stable and metastable ordering in bulk and epitaxial semiconductor alloys and superlattices.
ISSN:0003-6951
DOI:10.1063/1.102695
出版商:AIP
年代:1990
数据来源: AIP
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12. |
On the feasibility of growing dilute CxSi1−xepitaxial alloys |
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Applied Physics Letters,
Volume 56,
Issue 8,
1990,
Page 734-736
J. B. Posthill,
R. A. Rudder,
S. V. Hattangady,
G. G. Fountain,
R. J. Markunas,
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摘要:
Dilute CxSi1−xepitaxial films have been grown on Si(100) by remote plasma‐enhanced chemical vapor deposition. Carbon concentrations of ∼3 at.% have been achieved at a growth temperature of 725 °C. No evidence for the formation or precipitation of SiC was found using x‐ray diffraction and transmission electron microscopy.
ISSN:0003-6951
DOI:10.1063/1.102696
出版商:AIP
年代:1990
数据来源: AIP
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13. |
Wafer fusion: A novel technique for optoelectronic device fabrication and monolithic integration |
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Applied Physics Letters,
Volume 56,
Issue 8,
1990,
Page 737-739
Z. L. Liau,
D. E. Mull,
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摘要:
Centimeter‐size single‐crystal InP or GaAs wafers have been fused together entirely, face to face or side by side, after a heat treatment in a graphite/quartz reactor which can press the wafers together through differential thermal expansion. Diodes formed by fusingp‐ andn‐type wafers showed normal current‐voltage characteristics and light emission. Fusion between lattice‐mismatched wafers (i.e., InP and GaAs) has also been demonstrated.
ISSN:0003-6951
DOI:10.1063/1.102697
出版商:AIP
年代:1990
数据来源: AIP
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14. |
AlxGa1−xAs‐GaAs vertical‐cavity surface‐emitting laser grown on Si substrate |
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Applied Physics Letters,
Volume 56,
Issue 8,
1990,
Page 740-742
D. G. Deppe,
Naresh Chand,
J. P. van der Ziel,
G. J. Zydzik,
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摘要:
Data are presented demonstrating room‐temperature operation of AlxGa1−xAs‐GaAs vertical‐cavity surface‐emitting lasers grown on Si substrates. The device structures are grown using molecular beam epitaxy and a grown‐in quarter‐wave AlAs‐GaAs stack is used as then‐side reflector and a nonalloyed Ag dot used as thep‐side reflector/contact. Pulsed threshold currents of ∼125 mA are obtained for a 15‐&mgr;m‐diam device.
ISSN:0003-6951
DOI:10.1063/1.102698
出版商:AIP
年代:1990
数据来源: AIP
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15. |
Scanning tunneling microscopy of [112¯] oriented steps on a cleaved Si(111) surface |
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Applied Physics Letters,
Volume 56,
Issue 8,
1990,
Page 743-745
Hiroshi Tokumoto,
Shigeru Wakiyama,
Kazushi Miki,
Shigeo Okayama,
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摘要:
Scanning tunneling microscopy on cleaved Si(111) surfaces reveals stress‐induced microstructures with two types of terraces: triangular‐shaped terraces and long and narrow terraces with parallel [112¯] oriented steps, which is contrary to the previous observation [1¯1¯2] steps. Dimer rows in Si(111) 2×1 structures are found on the triangular terraces. On the parallel‐stepped terraces, rows run in the [112¯] direction and their separation was appreciably smaller than that of the dimer rows in the 2×1 structure. A new model for this structure is proposed.
ISSN:0003-6951
DOI:10.1063/1.102699
出版商:AIP
年代:1990
数据来源: AIP
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16. |
Intersubband absorption in highly strained InGaAs/InAlAs multiquantum wells |
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Applied Physics Letters,
Volume 56,
Issue 8,
1990,
Page 746-748
Hiromitsu Asai,
Yuichi Kawamura,
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摘要:
Highly strained In0.66Ga0.34As/In0.30Al0.70As multiquantum wells (MQWs) are successfully grown on (001)InP substrates by moleular beam epitaxy. Good crystal quality in the strained MQWs is confirmed by clear excitonic peaks and sharp photoluminescence spectra. Intersubband absorption at a wavelength as short as 3.1 &mgr;m was obtained for the first time in uniformly Si‐doped strained MQWs.
ISSN:0003-6951
DOI:10.1063/1.102700
出版商:AIP
年代:1990
数据来源: AIP
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17. |
Role of native oxide layers in the patterning of InP by Ga ion beam writing and ion beam assisted Cl2etching |
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Applied Physics Letters,
Volume 56,
Issue 8,
1990,
Page 749-751
Y. L. Wang,
L. R. Harriott,
R. A. Hamm,
H. Temkin,
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摘要:
We have studied the mechanism of increased etch rate induced in InP substrates by focused Ga ion implantation and Cl2etching. We cannot account for the depth of surface steps formed in this process with a purely kinetic mechanism. The preferential etching of implanted areas is attributed instead to local modification or removal of native oxides from the surface of InP. The thin oxide layer effectively protects the substrate and inhibits Cl2etching. Consistent with the thermodynamic prediction, a cleaned InP(100) surface is etched by Cl2(5×10−4Torr) with a rate of approximately 1000 A˚/min at 200 °C. Surface steps as deep as 3 &mgr;m have been reproducibly prepared using an oxide mask believed to be approximately 20 A˚ thick. In the etching process, any substrate damage caused by the Ga beam writing is completely removed. The oxide mask, which can be patterned on a very fine scale by energetic particle bombardment, provides a new avenue forinsituprocessing of InP.
ISSN:0003-6951
DOI:10.1063/1.102701
出版商:AIP
年代:1990
数据来源: AIP
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18. |
Residual acceptor impurities in undoped high‐purity InP grown by metalorganic chemical vapor deposition |
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Applied Physics Letters,
Volume 56,
Issue 8,
1990,
Page 752-754
S. S. Bose,
I. Szafranek,
M. H. Kim,
G. E. Stillman,
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摘要:
Zn and an unidentified acceptor species, labeledA1, are the only residual acceptors that have been observed in a wide variety of undoped high‐purity InP samples grown by metalorganic chemical vapor deposition. Carbon is not incorporated at detectable concentrations as a residual acceptor in metalorganic chemical vapor deposited InP. However, the longitudinal and transverse optical phonon replicas of the free‐exciton recombination occur at the same energy as the donor/conduction band‐to‐acceptor peaks for C acceptors in low‐temperature photoluminescence spectra. Since these replicas are usually present in photoluminescence spectra measured under moderate or high optical excitation, care must be exercised so that these peaks are not misinterpreted as C‐related transitions.
ISSN:0003-6951
DOI:10.1063/1.102702
出版商:AIP
年代:1990
数据来源: AIP
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19. |
Low‐voltage electron beam lithography with a scanning tunneling microscope |
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Applied Physics Letters,
Volume 56,
Issue 8,
1990,
Page 755-757
C. R. K. Marrian,
R. J. Colton,
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摘要:
Studies of a polydiacetylene negative electron beam resist have been made in a scanning tunneling microscope operated in vacuum at pressures in the 10−8Torr range. The resist can be imaged if it is applied as a thin film to a conductive flat substrate and the tip bias voltage is chosen appropriately. An exposure threshold energy close to 8 eV has been observed for the formation of raised features in the resist. A minimum feature size of about 20 nm has been measured when written at an energy just above the exposure threshold. Details of the necessary substrate preparation are described together with the operation of the scanning tunneling microscope during imaging and exposure. The exposure dose is applied by raising the bias voltage for a specific time while keeping the tip‐sample current constant which has permitted insights into the mechanisms of the resist exposure.
ISSN:0003-6951
DOI:10.1063/1.102703
出版商:AIP
年代:1990
数据来源: AIP
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20. |
Strain‐induced two‐dimensional electron gas in [111] growth‐axis strained‐layer structures |
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Applied Physics Letters,
Volume 56,
Issue 8,
1990,
Page 758-760
E. S. Snow,
B. V. Shanabrook,
D. Gammon,
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摘要:
It is demonstrated that strain‐induced electric fields in [111] growth‐axis strained‐layer structures can be used to induce a two‐dimensional electron gas without the necessity of modulation doping. A simple analytic expression is derived for the density of the two‐dimensional electron gas. The density has a simple linear relationship to the strain‐induced electric fields. The calculation predicts that two‐dimensional densities in the range 1011–1012cm−2should be easily realized in strained‐layer structures. Results are calculated for a variety of material systems.
ISSN:0003-6951
DOI:10.1063/1.102704
出版商:AIP
年代:1990
数据来源: AIP
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