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21. |
Fundamental transverse electric field (TE0) mode selection for thin‐film asymmetric light guides |
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Applied Physics Letters,
Volume 21,
Issue 6,
1972,
Page 291-293
Yasuharu Suematsu,
Mitsuari Hakuta,
Kazuhito Furuya,
Kazuhiro Chiba,
Ritsuo Hasumi,
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摘要:
TE0mode selection was observed in an asymmetric dielectric light guide with a metal‐film outer coating. TM0mode and higher‐order modes could not transmit through the guide, whereas the loss of the TE mode, the insertion loss, was small. The experimental data were in good agreement with the theoretical results given here. Filter action is explained by modal repulsion from the metal wall that is inherent in an asymmetric guide.
ISSN:0003-6951
DOI:10.1063/1.1654383
出版商:AIP
年代:1972
数据来源: AIP
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22. |
Intense‐electron‐beam excitation of the 3371‐Å N2laser system |
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Applied Physics Letters,
Volume 21,
Issue 6,
1972,
Page 293-295
E.L. Patterson,
J.B. Gerardo,
A. Wayne Johnson,
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摘要:
The results of a parametric study of superradiant laser action at 3371 Å in the second positive band system of molecular nitrogen with excitation by a high‐energy electron beam are reported. Efficiency up to 0.15% was observed for conversion of electron‐beam power to laser power at 3371 Å. Laser output power up to 24 MW in a 6‐nsec pulse was observed.
ISSN:0003-6951
DOI:10.1063/1.1654384
出版商:AIP
年代:1972
数据来源: AIP
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23. |
X‐ray topographic observation of moving dislocations in silicon crystals |
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Applied Physics Letters,
Volume 21,
Issue 6,
1972,
Page 295-298
Jun‐ichi Chikawa,
Isao Fujimoto,
Takao Abe,
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PDF (308KB)
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摘要:
An instantaneous display of topographic images of individual dislocations was made by the combination of a high‐power x‐ray generator and a television unit with an x‐ray sensing PbO‐Vidicon camera tube. Si wafers were deformed by tension (about 300 g/mm2) at about 1000 °C in a vacuum furnace, and, simultaneously, moving dislocations were observed continuously with the television unit. The observation of dislocations moving as fast as 0.3 mm/sec may indicate the possibility that this technique can be a powerful tool in investigating the dynamic properties of dislocations.
ISSN:0003-6951
DOI:10.1063/1.1654385
出版商:AIP
年代:1972
数据来源: AIP
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