21. |
Influence of carrier kinetics on subpicosecond gain dynamics in diode laser amplifiers |
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Applied Physics Letters,
Volume 66,
Issue 22,
1995,
Page 2987-2989
S. Schuster,
H. Haug,
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摘要:
For a bulk GaAs semiconductor laser amplifier the evolution of the optical gain after a 200 fs pulse excitation is calculated by including carrier–carrier and LO‐phonon–carrier scattering in terms of the Boltzmann collision integrals. For an injected light pulse in the gain (absorption) region the optical gain shows a transient decrease (increase) followed by relaxation towards a lower (higher) level. Around the transparency point the broadening of the optical transition due to the decay of the induced interband polarization yields a transient decrease of the optical gain although the carrier density does not change. This behavior agrees qualitatively well with measurements of M. P. Kesler and E. P. Ippen [Appl. Phys. Lett.51, 1765 (1987)]. The temperature relaxation after the excitation is examined. ©1995 American Institute of Physics.
ISSN:0003-6951
DOI:10.1063/1.114252
出版商:AIP
年代:1995
数据来源: AIP
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22. |
Biased‐voltage controlled thinning for bonded silicon‐on‐insulator wafers |
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Applied Physics Letters,
Volume 66,
Issue 22,
1995,
Page 2990-2991
Qing‐An Huang,
Jun‐Ning Chen,
Xing‐Hua Fu,
Hui‐Zhen Zhang,
Qin‐Yi Tong,
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摘要:
A novel method for the preparation of bonded and etch‐back silicon‐on‐insulator is presented and demonstrated in which the surface of the to be thinned silicon wafer near the oxide is biased to inversion, so the bulk of this silicon wafer can be removed by anodic etching using the depletion layer as an etch stop. The high etching selectivity between the bulk silicon wafer and the depletion layer makes it possible to produce a micron/submicron‐thick active silicon layer with good thickness uniformity across a 3 in. silicon‐on‐insulator wafer. ©1995 American Institute of Physics.
ISSN:0003-6951
DOI:10.1063/1.114253
出版商:AIP
年代:1995
数据来源: AIP
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23. |
Light amplification device using organic electroluminescent diode coupled with photoresponsive organic pigment film |
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Applied Physics Letters,
Volume 66,
Issue 22,
1995,
Page 2992-2994
Tadashi Katsume,
Masahiro Hiramoto,
Masaaki Yokoyama,
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摘要:
An all‐organic light amplification device was designed using organic electroluminescent diode coupled with photoresponsive organic perylene pigment film as an electron photoinjecting layer. Amplification gain of photon conversion from red to red reached 25‐folds with the assistance of the large photocurrent multiplication in a perylene film. Moreover, optical switching behavior caused by the feedback of output light to the photoresponsive layer was observed. Since the spatial pattern of light was conserved, the present device has the potential to grow into new optoelectronic devices for optical image processing. ©1995 American Institute of Physics.
ISSN:0003-6951
DOI:10.1063/1.114254
出版商:AIP
年代:1995
数据来源: AIP
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24. |
Local lattice distortion relating to phosphorus antisite defect in phosphorus‐ion‐implanted GaP layer |
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Applied Physics Letters,
Volume 66,
Issue 22,
1995,
Page 2995-2997
K. Kuriyama,
Takashi Kato,
Satoru Tajima,
Tomoharu Kato,
Sin‐ichi Takeda,
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摘要:
The local lattice distortion relating to the phosphorus antisite defect (PGa) in the P+‐ion‐implanted GaP layer was studied using Rutherford backscattering (RBS), photoacoustic (PA), Raman scattering, and photoluminescence (PL) methods. The displacement fraction due to the excess phosphorus in 800 °C annealed samples is estimated to be ∼2×1020/cm3by RBS channeling measurements. The slight reduction of the LO‐TO phonon frequency splitting of the annealed P+‐ion‐implanted GaP with respect to the unimplanted one indicates the presence of PGa, corresponding tox=0.0084 of Ga1−xP1+x. This is consistent with the displacement fraction estimated by RBS. A PL emission relating to PGais observed at 716 mm (1.73 eV). ©1995 American Institute of Physics.
ISSN:0003-6951
DOI:10.1063/1.114255
出版商:AIP
年代:1995
数据来源: AIP
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25. |
Photoinduced intersubband transition in undoped HgCdTe multiple quantum wells |
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Applied Physics Letters,
Volume 66,
Issue 22,
1995,
Page 2998-3000
C. R. M. de Oliveira,
A. M. de Paula,
C. L. Cesar,
L. C. West,
C. Roberts,
R. D. Feldman,
R. F. Austin,
M. N. Islam,
G. E. Marques,
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摘要:
We present photoinduced intersubband absorption measurements in HgCdTe undoped quantum wells. The transition energies and the linewidths are well described by a full 8×8k⋅pKane model calculation. Also, based on this model we show that different in‐plane effective masses for the first and second electron subbands should be considered in order to properly fit the low energy side of the experimental spectra. The experimental results can be explained using the calculated intersubband oscillator strength with no exciton enhancement. ©1995 American Institute of Physics.
ISSN:0003-6951
DOI:10.1063/1.114256
出版商:AIP
年代:1995
数据来源: AIP
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26. |
Silicon nanostructures produced by laser direct etching |
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Applied Physics Letters,
Volume 66,
Issue 22,
1995,
Page 3001-3003
M. Mu¨llenborn,
H. Dirac,
J. W. Petersen,
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摘要:
A laser direct‐write process has been applied to structure silicon on a nanometer scale. In this process, a silicon substrate, placed in a chlorine ambience, is locally heated above its melting point by a continuous‐wave laser and translated by high‐resolution direct‐current motor stages. Only the molten silicon reacts spontaneously with the molecular chlorine, resulting in trenches with the width of the laser‐generated melt. Trenches have been etched with a width of less than 70 nm. To explain the functional dependence of the melt size on absorbed power, the calculations based on a two‐phase steady state heat model are presented, taking the temperature‐dependent thermal conductivities and optical parameters into account. ©1995 American Institute of Physics.
ISSN:0003-6951
DOI:10.1063/1.114257
出版商:AIP
年代:1995
数据来源: AIP
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27. |
Many‐body Coulomb effects in room‐temperature II–VI quantum well semiconductor lasers |
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Applied Physics Letters,
Volume 66,
Issue 22,
1995,
Page 3004-3006
W. W. Chow,
S. W. Koch,
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摘要:
This letter investigates the gain medium properties in II–VI blue‐green quantum well semiconductor lasers, including band structure and carrier interactions in the electron‐hole plasma are found to be significantly more important than in infrared III–V lasers. In particular, the interband Coulombic enhancement of the optical transitions, together with a band gap renormalization result in an increase in gain and a reduction in the antiguiding or linewidth enhancement factor. ©1995 American Institute of Physics.
ISSN:0003-6951
DOI:10.1063/1.114258
出版商:AIP
年代:1995
数据来源: AIP
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28. |
Inverse staggered polycrystalline and amorphous silicon double structure thin film transistors |
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Applied Physics Letters,
Volume 66,
Issue 22,
1995,
Page 3007-3009
Takashi Aoyama,
Kazuhiro Ogawa,
Yasuhiro Mochizuki,
Nobutake Konishi,
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摘要:
Inverse staggered polycrystalline silicon (poly‐Si) and hydrogenated amorphous silicon (a‐Si:H) double structure thin film transistors (TFTs) are fabricated based on the conventionala‐Si:H TFT process for the application to liquid crystal display panels with peripheral driver circuits integration. After depositing a thin (20 nm)a‐Si:H using the plasma chemical vapor deposition technique at 300 °C, Ar+and XeCl (300 mJ/cm2) lasers are irradiated on the peripheral driver circuits areas, and then thicka‐Si:H (200 nm) andn+Si layers are deposited again. Field effect mobilities of 10 and 0.5 cm2/V s are obtained for the laser annealed poly‐Si and thea‐Si:H (without annealing) TFTs, respectively. ©1995 American Institute of Physics.
ISSN:0003-6951
DOI:10.1063/1.114259
出版商:AIP
年代:1995
数据来源: AIP
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29. |
p+doping of Si by Al diffusion upon annealing Al/n‐Si(111)7×7 |
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Applied Physics Letters,
Volume 66,
Issue 22,
1995,
Page 3010-3012
H. J. Wen,
M. Prietsch,
A. Bauer,
M. T. Cuberes,
I. Manke,
G. Kaindl,
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摘要:
A novel method for the formation of ap+‐layer underneath a Si(111)7×7 surface is presented. It is based on annealing of an epitaxial Al/n‐Si(111) interface up to complete desorption of the Al film. This leads to a strong potential variation within the substrate, as observed in Si‐2pcore‐level photoemission spectra with variable sampling depth, while scanning‐tunneling microscopy reveals an unchanged 7×7 reconstructed surface. These observations are consistent with ap+doping of (4±2)×1018/cm3and a lowering of the surface Fermi level by (0.06±0.02) eV. ©1995 American Institute of Physics.
ISSN:0003-6951
DOI:10.1063/1.114260
出版商:AIP
年代:1995
数据来源: AIP
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30. |
Thickness effect on hydrogen plasma treatment on polycrystalline silicon thin films |
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Applied Physics Letters,
Volume 66,
Issue 22,
1995,
Page 3013-3014
Bor Wen Liou,
Yi Huang Wu,
Chung Len Lee,
Tan Fu Lei,
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摘要:
This letter studies the hydrogen plasma effects on the resistivity, effective free carrier concentration, and mobility of As+‐ and BF+2‐doped polycrystalline silicon (polysilicon) thin films of various thicknesses. It is found that the resistivity increases while the effective free carrier concentration decreases after the plasma treatment as the thickness of the polysilicon film decreases. The mobility typically tends to decrease for the thicker (≳60 nm) polysilicon film, but to increase for the thinner (<60 nm) polysilicon film. ©1995 American Institute of Physics.
ISSN:0003-6951
DOI:10.1063/1.114261
出版商:AIP
年代:1995
数据来源: AIP
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