21. |
Transmission electron microscope study of the formation of Ni2Si and NiSi on amorphous silicon |
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Applied Physics Letters,
Volume 50,
Issue 20,
1987,
Page 1453-1454
M. O. Aboelfotoh,
H. M. Tawancy,
F. M. d’Heurle,
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摘要:
The reaction of very thin (0.5–20 nm) layers of Ni with amorphous Si has been investigated by means of transmission electron microscopy and diffraction. The experiment, which is directly parallel to a previous study of similar samples prepared with Pd and Pt, has led to different observations. With Ni it is found that an amorphous Ni‐Si solution is formed first, and that silicide formation, at temperatures which decrease with the amount of deposited Ni, results from the crystallization of that amorphous phase. With Pt and Pd microcrystalline silicides had been observed immediately.
ISSN:0003-6951
DOI:10.1063/1.97799
出版商:AIP
年代:1987
数据来源: AIP
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22. |
Magnetic imaging by ‘‘force microscopy’’ with 1000 A˚ resolution |
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Applied Physics Letters,
Volume 50,
Issue 20,
1987,
Page 1455-1457
Y. Martin,
H. K. Wickramasinghe,
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摘要:
We describe a new method for imaging magnetic fields with 1000 A˚ resolution. The technique is based on using a force microscope to measure the magnetic force between a magnetized tip and the scanned surface. The method shows promise for the high‐resolution mapping of both static and dynamic magnetic fields.
ISSN:0003-6951
DOI:10.1063/1.97800
出版商:AIP
年代:1987
数据来源: AIP
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