31. |
Characterization of resonant tunneling paths in current–voltage characteristics line shapes |
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Applied Physics Letters,
Volume 67,
Issue 18,
1995,
Page 2675-2677
P. H. Rivera,
P. A. Schulz,
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摘要:
We analyze the current density‐voltage characteristics of double‐barrier tunneling diodes, with different spacer layers, within the framework of a Poisson solver together with a coherent tunneling approximation for transmission probabilities. We show that varying the spacer layer thickness, together with barrier heights, changes dramatically the current density‐voltage characteristics line shape, which is revealed to be an important qualitative signature of the tunneling paths involved in the double‐barrier diodes under operation. ©1995 American Institute of Physics.
ISSN:0003-6951
DOI:10.1063/1.114289
出版商:AIP
年代:1995
数据来源: AIP
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32. |
Thermal stress‐induced, high‐strain fragmentation of buried SiGe layers grown on Si |
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Applied Physics Letters,
Volume 67,
Issue 18,
1995,
Page 2678-2680
M. Fatemi,
P. E. Thompson,
M. E. Twigg,
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摘要:
Buried Si1−xGexlayers grown on Si at elevated temperatures of 700 to 800 °C generally exhibit x‐ray rocking curves which are significantly broader than those predicted for perfect crystals, suggesting that the layers are strain‐relieved. However, calculations using these rocking curves show the materials to be either nearly‐ or fully‐strained. The source of x‐ray broadening accompanied by high strain is found to be an abrupt, thermally‐induced fragmentation of the layer into small, slightly misoriented regions during the cool‐down, such that the as‐grown strain remains unchanged. The fragments are typically rectangles a few micrometers wide, with well‐defined boundaries along [110]‐type directions.
ISSN:0003-6951
DOI:10.1063/1.114290
出版商:AIP
年代:1995
数据来源: AIP
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33. |
Mechanism of suppression of Auger recombination processes in type‐II heterostructures |
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Applied Physics Letters,
Volume 67,
Issue 18,
1995,
Page 2681-2683
Georgy G. Zegrya,
Aleksey D. Andreev,
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摘要:
The mechanism of Auger recombination in type‐II heterostructures is studied theoretically. It is shown that the Auger recombination rate is a power function of temperature rather than an exponential function as in bulk materials. The feasibility of suppression of the Auger recombination process in the type‐II heterostructures is demonstrated. The possibility of controlling the Auger recombination rate is shown to be very important for development of optoelectronic devices with improved characteristics. ©1995 American Institute of Physics.
ISSN:0003-6951
DOI:10.1063/1.114291
出版商:AIP
年代:1995
数据来源: AIP
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34. |
Resonant‐tunneling injection hot electron laser: An approach to picosecond gain‐switching and pulse generation |
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Applied Physics Letters,
Volume 67,
Issue 18,
1995,
Page 2684-2686
Valery I. Tolstikhin,
Magnus Willander,
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摘要:
Recently, we proposed a three‐terminal laser structure for fast gain‐switching application using carrier heating, where hot electrons with well‐defined and variable energy are injected into an active region via resonant tunneling. A picosecond pulse generation from this device has now been analyzed, including associated transport phenomena and structure design. By means of numerical modeling we demonstrate that a resonant‐tunneling injection hot electron laser is capable of generating well‐shaped optical pulses switched by varying the injected electron energy. ©1995 American Institute of Physics.
ISSN:0003-6951
DOI:10.1063/1.114292
出版商:AIP
年代:1995
数据来源: AIP
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35. |
Photoluminescence of ytterbium‐doped porous silicon |
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Applied Physics Letters,
Volume 67,
Issue 18,
1995,
Page 2687-2689
T. Kimura,
A. Yokoi,
Y. Nishida,
R. Saito,
S. Yugo,
T. Ikoma,
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摘要:
Yb3+‐related photoluminescence is observed at room temperature from Yb‐doped porous silicon layers prepared by the electro‐chemical method developed by our group for Er doping of porous silicon layers. After rapid thermal annealing in a pure argon atmosphere at high temperatures (above ∼ 900 °C), samples show a sharp photoluminescence band at around 1.0 &mgr;m which is assigned to the intrashell 4f‐4ftransitions2F5/2→2F7/2of Yb3+. The enlarged energy bandgap of silicon as a result of anodization makes possible the excitation of Yb3+4f‐electrons with the recombination energy of photocarriers generated in the host porous silicon layers. ©1995 American Institute of Physics.
ISSN:0003-6951
DOI:10.1063/1.114293
出版商:AIP
年代:1995
数据来源: AIP
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36. |
Growth and characterization of pseudomorphic single crystal zinc blende MnS |
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Applied Physics Letters,
Volume 67,
Issue 18,
1995,
Page 2690-2692
B. J. Skromme,
Y. Zhang,
David J. Smith,
S. Sivananthan,
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摘要:
We report the growth and characterization of crystalline, single‐phase zinc blende MnS (i.e., &bgr;‐MnS). The material was grown on ZnSe buffer layers on (100) GaAs substrates, using solid‐source molecular beam epitaxy and a novel valved S cracker with deposition at low (∼110 °C) substrate temperatures. Characterization by reflection high energy electron diffraction, high resolution transmission electron microscopy, and low temperature photoluminescence confirms the pseudomorphic nature of the growth. Beyond a certain critical thickness, the layers either become amorphous or convert into the equilibrium rock salt polymorph (&agr;‐MnS), depending on the growth temperature. ©1995 American Institute of Physics.
ISSN:0003-6951
DOI:10.1063/1.114294
出版商:AIP
年代:1995
数据来源: AIP
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37. |
Stability of nitrided silicon dioxide deposited by reactive sputtering |
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Applied Physics Letters,
Volume 67,
Issue 18,
1995,
Page 2693-2695
Emil V. Jelenkovic,
K. Y. Tong,
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摘要:
The electrical properties of nitrided silicon dioxide formed by reactive sputtering in Ar/O2/N2plasma from the SiO2target have been studied. The nitrogen mixing ratio was varied from 0% to 15%, with the argon mixing ratio kept at 80%. It is found that as more nitrogen is incorporated, the leakage current increases for electron injection from both aluminum and silicon. By nitrogen reactive sputtering, the interface states generation during constant current stress is greatly reduced in comparison with oxide sputtered in only an Ar/O2gas mixture. A mixture ratio of Ar/O2/N2equal to 80:15:5 is found to give optimum oxide quality with good resistance to interface states generation and low leakage current. ©1995 American Institute of Physics.
ISSN:0003-6951
DOI:10.1063/1.114295
出版商:AIP
年代:1995
数据来源: AIP
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38. |
Infrared evidence for inhomogeneity in SiO2films grown by plasma assisted oxidation of Si |
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Applied Physics Letters,
Volume 67,
Issue 18,
1995,
Page 2696-2698
C. Martinet,
R. A. B. Devine,
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摘要:
The longitudinal optic vibrational mode associated with the asymmetric stretch of the bridging oxygen atom has been studied in amorphous SiO2grown by plasma assisted oxidation of Si. In films ≤70 nm thick the mode is observed displaced by −6 cm−1with respect to the bulk value (1256 cm−1). Deconvolution of the spectra combined with chemical etchback of the films shows that they are inhomogeneous, the peak shift increasing to −12 cm−1near the Si/SiO2interface in films thicker than ∼20 nm. ©1995 American Institute of Physics.
ISSN:0003-6951
DOI:10.1063/1.114296
出版商:AIP
年代:1995
数据来源: AIP
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39. |
Synthesis of GaN by N ion implantation in GaAs (001) |
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Applied Physics Letters,
Volume 67,
Issue 18,
1995,
Page 2699-2701
X. W. Lin,
M. Behar,
R. Maltez,
W. Swider,
Z. Liliental‐Weber,
J. Washburn,
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摘要:
Both the hexagonal and cubic GaN phases were synthesized in GaAs (001) by 50 keV N ion implantation at 380 °C and subsequent furnace annealing at 850–950 °C for 10 min–2 h. For a fluence of 1.5×1017cm−2, transmission electron microscopy revealed that cubic GaN epitaxially crystallizes as precipitates in the GaAs matrix. A cubic‐to‐hexagonal GaN phase transition was observed for extended thermal anneals. By increasing the N fluence to 3×1017cm−2, a continuous buried layer of randomly oriented hexagonal‐GaN nanocrystals was produced. ©1995 American Institute of Physics.
ISSN:0003-6951
DOI:10.1063/1.114297
出版商:AIP
年代:1995
数据来源: AIP
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40. |
Green luminescence from copper doped zinc sulphide quantum particles |
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Applied Physics Letters,
Volume 67,
Issue 18,
1995,
Page 2702-2704
Ali Azam Khosravi,
Manisha Kundu,
Lalita Jatwa,
S. K. Deshpande,
U. A. Bhagwat,
Murali Sastry,
S. K. Kulkarni,
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摘要:
Free‐standing powder of zinc sulphide quantum particles has been synthesized using a chemical route. X‐ray diffraction analysis shows that the diameter of the particles is ∼21±2 A˚ which is smaller than the Bohr exciton diameter for zinc sulphide. UV absorption shows an excitonic peak centered at ∼300 nm corresponding to an energy gap of 4.1±0.1 eV. These particles show a luminescence band at ∼424 nm. The quantum particles could be doped with copper during synthesis without altering the UV absorption or x‐ray diffraction pattern. However, doping shifted the luminescence to 480 nm, green wavelength in the visible region. ©1995 American Institute of Physics.
ISSN:0003-6951
DOI:10.1063/1.114298
出版商:AIP
年代:1995
数据来源: AIP
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