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31. |
Mobility enhancements in AlGaN/GaN/SiC with stair-step and graded heterostructures |
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Applied Physics Letters,
Volume 70,
Issue 19,
1997,
Page 2583-2585
C. F. Lin,
H. C. Cheng,
J. A. Huang,
M. S. Feng,
J. D. Guo,
G. C. Chi,
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摘要:
In this letter, we report the observation of the enhanced electron mobility in three different Al0.08Ga0.92N/GaN heterostructures. These structures were deposited on (0001) 6H-SiC substrates by using the low-pressure metalorganic chemical vapor deposition method. The structure was composed of 500 Å AlGaN compositional stair-step layer deposited onto 1.3&mgr;m GaN epitaxial layer. There is a 100 Å GaN Cap layer on top of the AlGaN layer to prevent the oxidation of the AlGaN layer. By using the van der Pauw method of Hall measurement, the sheet carrier density and mobility for Al0.08Ga0.92N/GaN heterostructure are 6.6×1012cm-2and 5413 cm2/Vs at 77 K, respectively. This high value of mobility is, to the best of our knowledge, the first observed two-dimensional electron gas (2DEG) at the AlGaN/GaN stair-step type of heterostructure. Other interface structures such as graded composition and bulk composition structures were also prepared and 2DEG properties were observed. ©1997 American Institute of Physics.
ISSN:0003-6951
DOI:10.1063/1.118940
出版商:AIP
年代:1997
数据来源: AIP
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32. |
Ultraviolet (340–390 nm), room temperature, photoluminescence from InAs nanocrystals embedded inSiO2matrix |
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Applied Physics Letters,
Volume 70,
Issue 19,
1997,
Page 2586-2588
Jianzhong Shi,
Kaigui Zhu,
Qingqi Zheng,
Lide Zhang,
Ling Ye,
Jianxin Wu,
Jian Zuo,
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摘要:
InAs nanocrystals embedded inSiO2matrix have been fabricated by a radio-frequency magnetron co-sputtering technique without postannealing. X-ray photoelectron spectra and Raman spectroscopy strongly suggest the existence of InAs nanocrystals in theSiO2matrix. From the optical absorption spectrum, the absorption edge exhibits a very large blueshift of 3.3 eV with respect to that of bulk InAs. The double-peak ultraviolet photoluminescence is observed. Our experimental results show that this double-peak phenomenon originates from the radiative recombination of the quantum-confined electron-heavy hole excitons and electron-split-off hole excitons. ©1997 American Institute of Physics.
ISSN:0003-6951
DOI:10.1063/1.118926
出版商:AIP
年代:1997
数据来源: AIP
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33. |
In situselective etching of GaAs for improving (Al)GaAs interfaces using tris-dimethylaminoarsenic |
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Applied Physics Letters,
Volume 70,
Issue 19,
1997,
Page 2589-2591
N. Y. Li,
Y. M. Hsin,
W. G. Bi,
P. M. Asbeck,
C. W. Tu,
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摘要:
We have investigated thein situchemical beam etching (CBET) process of (Al)GaAs using tris-dimethylaminoarsenic (TDMAAs) within a chemical beam epitaxy chamber. The optimal CBET condition of (Al)GaAs is established, according to the analysis of atomic force microscopy, capacitance–voltage carrier profiles, and current–voltage(I–V)measurements. This CBET process using TDMAAs is shown to provide a good etching selectivity (>20) of GaAs overAlxGa1−xAs(x⩾0.35)with a very smooth etched surface at the nanometer scale and a clean etched/regrown interface for regrowth applications. ImprovedI–Vcharacteristics of etched/regrownp-nAlxGa1−xAs(x⩽0.35)junctions is also successfully demonstrated when the GaAs cap layer is preferentially etched first by TDMAAs before regrowth ofAlxGa1−xAs.©1997 American Institute of Physics.
ISSN:0003-6951
DOI:10.1063/1.119087
出版商:AIP
年代:1997
数据来源: AIP
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34. |
InN-based Ohmic contacts to InAlN |
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Applied Physics Letters,
Volume 70,
Issue 19,
1997,
Page 2592-2594
S. M. Donovan,
J. D. MacKenzie,
C. R. Abernathy,
S. J. Pearton,
F. Ren,
K. Jones,
M. Cole,
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摘要:
The ability to form low resistance Ohmic contacts to InAlN using refractory metallization on In-containing contact layers has been investigated. The crystal quality as measured by surface roughness and x-ray diffraction was found to be a determining factor in the contact resistance which could be obtained usingWSixcontacts. InN growth conditions which resulted in poorer structural quality, such as the use of GaAs rather than sapphire substrates, low nitrogen flows, and low growth temperatures, resulted in contact resistances of10−4–10−3 &OHgr; cm2, as compared to∼10−5 cm2for InAlN alone. Using optimized conditions, contact resistances to InAlN of∼3.5×10−6 &OHgr; cm2were obtained. ©1997 American Institute of Physics.
ISSN:0003-6951
DOI:10.1063/1.118927
出版商:AIP
年代:1997
数据来源: AIP
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35. |
Novel method to determine the off-diagonal element of the dielectric tensor in a magnetic medium |
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Applied Physics Letters,
Volume 70,
Issue 19,
1997,
Page 2595-2597
Chun-Yeol You,
Sung-Chul Shin,
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摘要:
A new method to determine the off-diagonal element of the dielectric tensor from the measurements ofp- ands-wave Kerr rotation angles, without measuring the ellipticity is reported on in this letter. The method has been verified by determining the off-diagonal elements of Cu/Co multilayer having in-plane magnetization and Co/Pd multilayer having perpendicular magnetization. ©1997 American Institute of Physics.
ISSN:0003-6951
DOI:10.1063/1.118928
出版商:AIP
年代:1997
数据来源: AIP
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36. |
Mechanically detected nuclear magnetic resonance image of a multilayer system at normal pressure |
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Applied Physics Letters,
Volume 70,
Issue 19,
1997,
Page 2598-2600
Arnd Schaff,
Wiebren S. Veeman,
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摘要:
Magnetic resonance force microscopy (MRFM) is a new microscopy technique that combines the spin selective detection of nuclear or electron spin resonance with the high spatial resolution of atomic force microscopy. In this letter we present MRFM measurements on a three-layer system in the micron range. We detected the one-dimensional distribution of proton spins in a sample that consisted of two-ammonium sulphate layers and an intermediate layer of sodium chloride. The experiments were done at room temperature and normal pressure, in contrast to earlier MRFM measurements that have been carried out in vacuum at room temperature or low temperatures. ©1997 American Institute of Physics.
ISSN:0003-6951
DOI:10.1063/1.118929
出版商:AIP
年代:1997
数据来源: AIP
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37. |
MagnetostrictiveSmFe2/metalcomposites |
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Applied Physics Letters,
Volume 70,
Issue 19,
1997,
Page 2601-2603
F. E. Pinkerton,
T. W. Capehart,
J. F. Herbst,
E. G. Brewer,
C. B. Murphy,
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摘要:
We have fabricated novel magnetostrictive composites consisting ofSmFe2embedded in an Fe or Al matrix which feature high magnetostriction and good mechanical strength. Hot pressed composites of 50&percent;SmFe2/50&percent;Fe or Al by volume have magnetostrictive strains parallel to the applied magnetic field,&lgr;∥,between−280and−440ppm when consolidated at 610 (Fe) or 540 °C (Al). One unique feature of this work is the production of the magnetostrictiveSmFe2component by melt spinning; ribbon-based composites with Al combine significant magnetic coercivity,Hci=3 kOe,with high magnetostriction (&lgr;∥=−280 ppm). Unlike their brittleSmFe2parent materials, the composites are easily machinable. ©1997 American Institute of Physics.
ISSN:0003-6951
DOI:10.1063/1.118930
出版商:AIP
年代:1997
数据来源: AIP
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38. |
Suppression of the increase of high-temperature coercivity in MnBi thin films by Al interlayers |
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Applied Physics Letters,
Volume 70,
Issue 19,
1997,
Page 2604-2606
U. Ru¨diger,
T. Roos,
G. Gu¨ntherodt,
B. Holla¨nder,
P. Fumagalli,
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摘要:
By tailoring the microcrystalline structure of MnBi films, using Al interlayers, a reduction of the high-temperature coercivity by a factor of 3 is achieved. The separation of Bi/Mn bilayers by Al interlayers acts as a diffusion barrier perpendicular to the surface. After annealing, the MnBi layers contain single-domain particles surrounded by an Al matrix exhibiting no significant increase of the coercive field with increasing temperature. ©1997 American Institute of Physics.
ISSN:0003-6951
DOI:10.1063/1.118931
出版商:AIP
年代:1997
数据来源: AIP
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39. |
Finite-element modelling of magnetostrictive bending of a coated cantilever |
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Applied Physics Letters,
Volume 70,
Issue 19,
1997,
Page 2607-2609
R. Watts,
M. R. J. Gibbs,
W. J. Karl,
H. Szymczak,
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摘要:
Finite element modelling was applied to the bending behaviour of a cantilever coated with a magnetostrictive film. The model is verified by comparison with accepted analytical solutions, then extended to the more realistic case in which one end of the cantilever is rigidly clamped across the width. It is shown that the central deflection of the end of the cantilever is a function of the geometric aspect ratio. An empirical correction factor is suggested to account for this variation. ©1997 American Institute of Physics.
ISSN:0003-6951
DOI:10.1063/1.118932
出版商:AIP
年代:1997
数据来源: AIP
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40. |
Shape-anisotropy-controlled magnetoresistive response in magnetic tunnel junctions |
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Applied Physics Letters,
Volume 70,
Issue 19,
1997,
Page 2610-2612
Yu Lu,
R. A. Altman,
A. Marley,
S. A. Rishton,
P. L. Trouilloud,
Gang Xiao,
W. J. Gallagher,
S. S. P. Parkin,
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摘要:
We show that shape anisotropy can be used to control the response characteristics of magnetic tunnel junctions. By varying the junction shape, the resistance versus field curve was made to vary from a nonhysteretic linear curve with a high-field sensitivity (0.3&percent;/Oe) to a hysteretic response curve with high squareness. ©1997 American Institute of Physics.
ISSN:0003-6951
DOI:10.1063/1.118933
出版商:AIP
年代:1997
数据来源: AIP
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