31. |
Synthesis of polymer‐metal composite thin films by pulsed excimer laser coablation |
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Applied Physics Letters,
Volume 58,
Issue 2,
1991,
Page 197-199
Madhavi Gitay,
Bharati Joglekar,
S. B. Ogale,
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摘要:
Polymer(polyamide)‐metal(Sn) composite thin films have been deposited by a new pulsed excimer laser copulation method. The composite character of the films has been established by the combined use of infrared transmission, x‐ray diffraction, Mo¨ssbauer spectroscopy, and scanning electron microscopy combined with energy dispersive analysis of x rays.
ISSN:0003-6951
DOI:10.1063/1.104921
出版商:AIP
年代:1991
数据来源: AIP
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32. |
Spin‐polarized secondary electron microscopy of written domains in CoNiCr and its correlation with noise measurements as a function of write current |
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Applied Physics Letters,
Volume 58,
Issue 2,
1991,
Page 200-202
T. VanZandt,
R. Browning,
S. Y. Lee,
M. R. Khan,
J. L. Pressesky,
S. L. Duan,
N. Heiman,
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摘要:
Spin‐polarized secondary electron microscope images of tracks of magnetic domains, written in Co62.5Ni30Cr7.5thin‐film longitudinal recording media, are presented as a function of write current. The corresponding modulation noise measurements are also presented for this sample. We observe that the magnetic microstructure visible in the images can be correlated with the modulation noise in each region of write current investigated. Explanations for the possible origins of this microstructure are presented.
ISSN:0003-6951
DOI:10.1063/1.104922
出版商:AIP
年代:1991
数据来源: AIP
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33. |
Laser‐assisted micron scale particle removal |
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Applied Physics Letters,
Volume 58,
Issue 2,
1991,
Page 203-205
K. Imen,
S. J. Lee,
S. D. Allen,
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摘要:
A novel laser‐assisted particle removal (LAPR) technique capable of removing micron scale particles from semiconductor substrates is presented. In our preliminary experiments the contaminated substrates were dosed with water which preferentially adsorbs in the capillary spaces under and around the particles and were subsequently irradiated with transverse, electric, atomspheric CO2laser pulses. At the CO2laser wavelength the beam energy is mainly absorbed in the water and not the substrate. The subsequent explosive evaporation of the adsorbed water molecules produces forces many orders of magnitude larger than the adhesion forces between the particle and the substrate which propel the particles off the substrate surface. LAPR is inherently clean and can easily be incorporated into current or planned wafer processing systems.
ISSN:0003-6951
DOI:10.1063/1.104923
出版商:AIP
年代:1991
数据来源: AIP
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