41. |
Effect of antiferromagnetic grain size on exchange-coupling field ofCr70Al30/Fe19Ni81bilayers |
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Applied Physics Letters,
Volume 71,
Issue 9,
1997,
Page 1258-1260
Hiroko Uyama,
Yoshichika Otani,
Kazuaki Fukamichi,
Osamu Kitakami,
Yutaka Shimada,
Jun-ichi Echigoya,
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摘要:
The exchange-coupling mechanism ofCr70Al30/Fe19Ni81bilayer films was investigated in terms of the crystallographic orientation, the interface roughness, and the grain size. The exchange-coupling fieldHexappears when theCr70Al30layer is thick enough to accommodate an antiferromagnetic domain wall. The value ofHexwas found to increase with decreasing the grain size in association with the [110] orientation. This tendency can be explained by considering the exchange-coupling field evaluated from the random field approximation. ©1997 American Institute of Physics.
ISSN:0003-6951
DOI:10.1063/1.119866
出版商:AIP
年代:1997
数据来源: AIP
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42. |
Nanostructure fabrication in silicon using cesium to pattern a self-assembled monolayer |
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Applied Physics Letters,
Volume 71,
Issue 9,
1997,
Page 1261-1263
R. Younkin,
K. K. Berggren,
K. S. Johnson,
M. Prentiss,
D. C. Ralph,
G. M. Whitesides,
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摘要:
This letter describes the formation of nanometer-scale features in a silicon substrate using a self-assembled monolayer (SAM) of octylsiloxane on silicon dioxide as a resist sensitive to a patterned beam of neutral cesium atoms. The mask that patterned the atomic beam was a silicon nitride membrane perforated with nm and &mgr;m scale holes, in contact with the substrate surface. In a two-step wet-chemical etching process, the pattern formed in the SAM was transferred first into theSiO2layer and then into an underlying silicon substrate. This process demonstrated the formation of silicon features with diameter∼60 nm.©1997 American Institute of Physics.
ISSN:0003-6951
DOI:10.1063/1.119867
出版商:AIP
年代:1997
数据来源: AIP
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43. |
Controlled morphology of biologically derived metal nanopatterns |
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Applied Physics Letters,
Volume 71,
Issue 9,
1997,
Page 1264-1266
Jon T. Moore,
Paul D. Beale,
Thomas A. Winningham,
Kenneth Douglas,
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摘要:
We report the ability to control the morphology of nanometer thick Ti oxide films that were created via a parallel nanofabrication process using a two-dimensional protein crystal as a template. Atomic force microscopy was used to examine the evolution of these structures from a periodic array of nanometer-scale dots (nanodots) to a screen containing a periodic array of nanometer-scale holes (nanoscreen) as the film thickness was increased. A Monte Carlo solid-on-solid simulation was then developed to explain the thickness dependence of the morphology as the metal film self-organizes into these nanopatterns. ©1997 American Institute of Physics.
ISSN:0003-6951
DOI:10.1063/1.119868
出版商:AIP
年代:1997
数据来源: AIP
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44. |
Electrode dependence of hydrogen-induced degradation in ferroelectricPb(Zr,Ti)O3andSrBi2Ta2O9thin films |
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Applied Physics Letters,
Volume 71,
Issue 9,
1997,
Page 1267-1269
Jin-Ping Han,
T. P. Ma,
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摘要:
Forming gas annealing causes changes in the remanent polarization(Pr),coercive field(Ec),and leakage current (I) in both PZT[Pb(Zr,Ti)O3]and SBT(SrBi2Ta2O9)samples with a variety of top electrode materials (Pt, Au, Ag, Cu, Ni, andIn2O3), and the degree of degradation depends strongly on the top electrode material. These results may be explained by a model that is based on the catalytic activities of the top electrode to dissociate hydrogen molecules into hydrogen atoms, with the latter subsequently migrating into PZT or SBT films to cause oxygen deficiency and its associated property degradation. This model can be expanded to explain the recovery phenomenon resulting from oxygen annealing, which also depends on the catalytic activity of the top electrode to produce atomic oxygen from molecular oxygen. ©1997 American Institute of Physics.
ISSN:0003-6951
DOI:10.1063/1.119869
出版商:AIP
年代:1997
数据来源: AIP
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45. |
Estimation of the second crossover in insulators using the electrostatic mirror in the scanning electron microscope |
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Applied Physics Letters,
Volume 71,
Issue 9,
1997,
Page 1270-1272
W. K. Wong,
J. C. H. Phang,
J. T. L. Thong,
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摘要:
A technique for measuring the second secondary emission crossover in insulators was developed. The method utilizes the behavior of an electrostatic mirror formed on insulating samples to estimate the current equilibrium point as well as the mirror potential. Current results show that the value of the second crossover for glass passivation obtained using this method is in general agreement with previous techniques. ©1997 American Institute of Physics.
ISSN:0003-6951
DOI:10.1063/1.119870
出版商:AIP
年代:1997
数据来源: AIP
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46. |
Electrostatic trapping of single conducting nanoparticles between nanoelectrodes |
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Applied Physics Letters,
Volume 71,
Issue 9,
1997,
Page 1273-1275
A. Bezryadin,
C. Dekker,
G. Schmid,
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摘要:
For molecular electronics, one needs the ability to electrically address a single conducting molecule. We report on the fabrication of stable Pt electrodes with a spacing down to 4 nm and demonstrate a new deposition technique, i.e., electrostatic trapping, which can be used to bridge the electrodes in acontrolledway with asingleconducting nanoparticle such as a conjugated or metal–cluster molecule. In electrostatic trapping, nanoparticles are polarized by an applied electric field and are attracted to the gap between the electrodes where the field is maximum. The feasibility of electrostatic trapping is demonstrated for Pd colloids. Transport measurements on a single Pd nanoparticle show single electron tunneling coexisting with tunnel-barrier suppression.©1997 American Institute of Physics.
ISSN:0003-6951
DOI:10.1063/1.119871
出版商:AIP
年代:1997
数据来源: AIP
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47. |
Comment on “Phototransformation in visible and near-IR femtosecond pump-probe studies ofC60films” [Appl. Phys. Lett.69, 296 (1996)] |
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Applied Physics Letters,
Volume 71,
Issue 9,
1997,
Page 1276-1276
S. V. Chekalin,
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ISSN:0003-6951
DOI:10.1063/1.119872
出版商:AIP
年代:1997
数据来源: AIP
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48. |
Response to “Comment on ‘Phototransformation in visible and near-IR femtosecond pump-probe studies ofC60films’ ” [Appl. Phys. Lett.71, 1276 (1997)] |
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Applied Physics Letters,
Volume 71,
Issue 9,
1997,
Page 1277-1277
S. B. Fleischer,
B. Pevzner,
D. J. Dougherty,
E. P. Ippen,
M. S. Dresselhaus,
A. F. Hebard,
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PDF (14KB)
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ISSN:0003-6951
DOI:10.1063/1.119926
出版商:AIP
年代:1997
数据来源: AIP
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